Semiconductors » Test & Measurement (semiconductors)

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  • Mirtec MV-2HTX AOI bench top

    Mirtec MV-2HTX AOI bench top

    • Manufacturer: Mirtec

    Mirtec MV-2HTX Bench Top AOI Desktop Type Vision Inspector Vintage: 2007 Three Layer Programmable LED Light Source Min PCB: 2”x 2” Max PCB: 26"x 24" Pre And Post Reflow Inspection Capability. Automatic Tea...

    Minnesota, USA
  • CyperOptics QX500 AOI

    CyperOptics QX500 AOI

    • Manufacturer: Cyberoptics
    • Model: QX500

    CyperOptics QX500 AOI DOM: 09/2010 2D Inspection Max Board: 12"x18" Board Thickness: 1mm to 5mm Component Height: 3.0 mm (Top & Bottom) Left to Right Process Flow SMEMA Dims: 40" x 50" x 55"H Weight: 905...

    United States
  • Tektronix 371A

    Tektronix 371A

    • Manufacturer: Tektronix
    • Model: 371A

    Tektronix 371A Details Tektronix 371A The 371A Programmable Curve Tracer, the industry leader in high power curve tracers is used for testing a wide variety of power semiconductors. It performs DC parametric char...

    Lake Mary, FL
  • Tektronix 371B

    Tektronix 371B

    • Manufacturer: Tektronix
    • Model: 371B

    Tektronix 371B Details Tektronix 371B Programmable Curve Tracer - Tektronix curve tracers offer power and versatility to test the DC characteristics of semiconductor devices. The 370B and 371B curve tracers combi...

    Lake Mary, FL
  • Tektronix 370A

    Tektronix 370A

    • Manufacturer: Tektronix
    • Model: 370A

    The Tektronix 370A is a Programmable Curve Tracer. The world standard for high resolution curve tracers is used in a wide variety of applications. The 370A will perform DC parametric characterization of transisto...

    Webster, MA
  • 2006 Orbotech Symbion P36 3D

    2006 Orbotech Symbion P36 3D SPI

    • Manufacturer: Orbotech

    Automatic 3D Solder Paste Inspection Max board size : 20 x 21 in. Paste Height Range 50-300μm (0.2 – 12 mil) Inspection speed : Up to 60 sq. cm/sec (9.3 sq. in/sec) Height Accuracy / Repeatability 5 μm (0.2 mil) ...

    Springtown, TX
  • Automated Opticai inspection system(AOI)

    Automated Opticai inspection system(AOI)

      Incomparable True 3D Inspection PerformancePowerful Side-View CameraAdvanced Tall Component InspectionSelf-Diagnosis for Optimal Performance MaintenanceAI-Powered Auto Programming (KAP)KSMART Solutions: True 3D M...

      Suzhou, China
    • Rudolph FE-VII-SD

      Rudolph FE-VII-SD

      • Manufacturer: Rudolph

      For sale is a high-precision Rudolph FE-VII-SD Ellipsometer, known for its advanced capabilities in thin film measurement and analysis. This tool is ideal for semiconductor manufacturing, materials research, and ...

      $4,950 USD
      Hayward, CA
    • HITACHI S8000、S9000シリーズ

      HITACHI S8000、S9000シリーズ

      • Manufacturer: Hitachi

      Equipment Refurbishment Used Equipment Refurbish Sales Modification for small-diameter and compound wafer SMIF to open cassette modification Modification for multiple wafer types (using tray use lay) Periodic mai...

      Tokyo, Japan
    • 1980 test test

      1980 test test

      • Manufacturer: test

      Process: test | Size(mm): 100mm

      Yongin-si, South Korea
    • MICROMANIPULATOR MM8065 (PROBE)

      MICROMANIPULATOR MM8065 (PROBE)

      • Manufacturer: Micromanipulator
      • Model: MM8065

      Process: METROLOGY | Size(mm): 200mm

      Yongin-si, South Korea
    • 2005 MOSAID MS-4205

      2005 MOSAID MS-4205

      • Manufacturer: Mosaid

      Process: TEST | Size(mm): 200mm

      Yongin-si, South Korea
    • 2001 MOSAID MS-4205

      2001 MOSAID MS-4205

      • Manufacturer: Mosaid

      Process: TEST | Size(mm): 200mm

      Yongin-si, South Korea
    • 2003 MOSAID MS-4205

      2003 MOSAID MS-4205

      • Manufacturer: Mosaid

      Process: TEST | Size(mm): 200mm

      Yongin-si, South Korea
    • 1996 Nanometrics Nanospec8000

      1996 Nanometrics Nanospec8000

      • Manufacturer: Nanometrics
      • Model: Nanospec

      5. Wafer Size : Process: MET | Shipping: EXW

      South Korea
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    Overview

    Semiconductor inspection and test equipment are specialized machines used to ensure the quality and functionality of semiconductor devices. These machines perform various tests and inspections, including visual inspection, electrical testing, and defect analysis, to identify and address any issues in the semiconductor manufacturing process. They are crucial in maintaining the high standards required in the semiconductor industry.

    FAQ

    What factors should I consider when buying semiconductor inspection and test equipment?

    Consider the equipment's compatibility with your existing systems, the types of tests it performs, its accuracy, and the manufacturer's support and service options. Also, evaluate its overall condition and any included software or accessories.

    How can I ensure safe shipping of semiconductor inspection and test equipment?

    Use a specialized transport service experienced in handling delicate and high-value equipment. Ensure the equipment is properly packaged, secured, and insured during transit.

    What maintenance is required for semiconductor inspection and test equipment?

    Regular maintenance includes cleaning, calibration, and software updates. Follow the manufacturer’s guidelines for specific maintenance intervals and procedures to ensure optimal performance and longevity of the equipment.