- Trusted Seller
KLA-Tencor 740-22103-001 Chuck Assembly eS31 E-Beam Wafer Inspection Working
- Manufacturer: KLA-Tencor
“Removed from a KLA-Tencor eS31 E-Beam Wafer Inspection System” KLA-Tencor 740-22103-001 Chuck Assembly eS31 E-Beam Wafer Inspection Working Inventory # 21039 Rev. AA Removed from a KLA-Tencor eS31 E-Beam Wafer I...
$1,504 USDAlbuquerque, NM - Trusted Seller
KLA-Tencor 200mm Wafer Inspection Stage Assembly 710-400535-00 Working Surplus
- Manufacturer: KLA-Tencor
KLA-Tencor 200mm Wafer Inspection Stage Assembly 710-400535-00 Working Surplus Model No: Inspection Stage Removed from a KLA-Tencor 5100 200mm Overlay Registration System Installed Components This KLA-Tencor 200m...
$1,802 USDAlbuquerque, NM 
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
- Trusted Seller
KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTIONSYSTEM consisting of:- Model: SP1 DLS with 300mm Single FOUP/FIMS Handler (other handlers available)- Currently Configured for 200/300mm Wafers - Unpatter...
Decatur, GA - Trusted Seller
KLA AIT II system
- Manufacturer: KLA-Tencor
- Model: AIT II
Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...
United States - Trusted Seller
2006 KLA eS32 e-beam wafer inspection 200mm
- Manufacturer: KLA-Tencor
KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This sy...
United States - Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States - Trusted Seller
Bree, Ireland - Trusted Seller
KLA-Tencor Surfscan SP1 DLS
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-Tencor Surfscan SP1 DLS The Surfscan SP1 DLS unpatterned wafer inspection system captures yield-limiting defects down to 50nm at high throughput, to accelerate yield learning rates across all process modules ...
Bree, Ireland - Trusted Seller
1985 KLA SURFSCAN 6220
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
Wafer Size 200 mm Fab Section Metrology Tool Status Running Wafers Asset Description PCT0009(SMP-CTECH) Software Version WIN95 CIM GEM Process DO MEASUREMENT Options System NA OK Others LPT 1 OK Main Sys...
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