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Tektronix 4200A-SCS
- Manufacturer: Tektronix
- Model: 4200
The 4200A-SCS is a customizable and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization. The hi...

Agilent/Keysight 4155B
- Manufacturer: Agilent - Keysight
- Model: 4155B
The 4155B Semiconductor Paramer Analyzer is used to evaluate materials with measurements to 1 fA and 1 µV, automatically extract process parameters without manually manipulating screen markers, measures leakage c...
- Trusted Seller
Yestech YTV-F1
- Manufacturer: Yestech
Top Down Viewing Camera 120VAC 1500W Max YESTech’s advanced Thin Camera technology offers high-speed PCB inspection with exceptional defect coverage. With up to two top-down viewing cameras and four side...
Magnolia, TX 
Tektronix 4225-PMU
- Manufacturer: Tektronix
- Model: 4225-PMU
Ultra-fast I-V sourcing and measuring have become increasingly important capabilities for many technologies, including compound semiconductors, medium power devices, non-volatile memory, MEMS devices and more. Th...

KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
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RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States 
ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM
- Manufacturer: Orbotech
INFORMATION: ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM MODEL: FPI-7092 M SERIAL NO: SF 021005 DATE OF MFG: 06-2002 VOLTAGE: 120 VAC AMP: 32A FREQUENCY: 50/60 HZ The Orbotech FPI-7092 System is an AOI ...
Santa Barbara, CA
KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CA
