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KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...

ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM
- Manufacturer: Orbotech
INFORMATION: ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM MODEL: FPI-7092 M SERIAL NO: SF 021005 DATE OF MFG: 06-2002 VOLTAGE: 120 VAC AMP: 32A FREQUENCY: 50/60 HZ The Orbotech FPI-7092 System is an AOI ...
Santa Barbara, CA
KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CA
