RMS Systems/Hologenix NGS 3500 Defect Detection System
used
- Automatic Defect Detection & Classification - Automated Die Inspection - Precision Dimensional Metrology - Critical Dimension (CD) and Overlay Metrology - Automatic and Manual Operation - Surface & Edge Defect ...
SBT Fully Automated Wafer Ultrasonic Scanning Microscope
new
- Manufacturer: SBT
Scope of Application Suitable for 6, 8, 12-inch wafer bonding inspection Equipment Advantages Loadport can be interfaced with standard Cassette etc. Wafer-specific Robot for sampling, barcode reading, and sample ...
Shanghai, China
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