Used Test & Measurement (Semiconductors) in California, USA

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Semiconductor Diagnostics Inc. Model SPV CMS 4010
- used
- Manufacturer: Semiconductor Diagnostics Inc.
Semiconductor Diagnostics Inc. Model SPV CMS 4010 (SPV CMS 4010) Semiconductor Diagnostics Inc.* Model SPV CMS 4010* Surface Change Analysis* Serial # 94-110085* Wavelength 790 nm Lop...
Rocklin, CA
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2019 Nordson 7012590
- used
- Manufacturer: Nordson
Nordson Digital Syringe Dispenser, Model 7012590, Serial Number 8922557012590, Year 2019, Ultimus V, Power 100-240 Volts / 50/60 Hertz / .5 Amps / 1 Phase, Dimensions 10 In. x 8 In. x 4 In., Notes Powers ON, Cond...
La Mirada, CA
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Nordson 7363256
- used
- Manufacturer: Nordson
3 ea. Nordson Dispensing System Controls, Model 7363256, Serial Number A04959, A02269, A051767363256, Performus X100 Series, Additional Options To Include 1 Each Height Sensor, Power 24 Volts / .75 Amps / 1 Phase...
La Mirada, CA
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Nanometrics Nanoline V CD Measure
- used
- Manufacturer: Nanometrics
Nanometrics Nanoline V CD Measure (Nanoline V)
Rocklin, CA
Agilent 4156C Semiconductor Parameter Analyzer
- used
- Manufacturer: Agilent - Keysight
- Model: 4156C
General features - Highly accurate laboratory bench top parameter analyzer for advanced device characterization - 4x High-resolution SMU, 2xVSU and 2xVMU - Fill-in-the blanks front panel operation - Measurement c...
$17,900 USD
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Est. $352/mo
San Jose, CA
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Nanometrics Nanoline CRD III Measure
- used
- Manufacturer: Nanometrics
Nanometrics Nanoline CRD III Measure (Nanoline CRD III Measure)
Rocklin, CA
KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
- used
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CA
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Nanometrics Nanoline 50 CD Measurement System
- used
- Manufacturer: Nanometrics
Nanometrics Nanoline 50 CD Measurement System (Nanometrics 50 CD) Nanometrics Nanoline 50 CD Measurement System - Model Nanoline 50, Main System - Capable of Measuring up to 4" Wafers - 10X Eyepieces - 10X,...
Rocklin, CA
SEMITOOL 14837-01 BOARD ASSY SERIAL 4 CHANNEL 202 REV K
- used
- Manufacturer: Semitool
INFORMATION: SEMITOOL 14837-01 BOARD ASSY SERIAL 4 CHANNEL 202 REV K System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT OPTIONS: ...
$1,199 USD
Santa Barbara, CA
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Keysight Technologies E5270B
- used
- Manufacturer: Agilent - Keysight
- Model: E5270B
Precision Measurement Mainframe; Precision IV Analyzer / 8 Slot Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with th...
Los Angeles, CA
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Keysight Technologies N1412A
- used
- Manufacturer: Agilent - Keysight
- Model: N1412A
Triaxial cable, 500 V, 1.5 m
Los Angeles, CA
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ADE 6033T Thickness Gauges
- used
- Manufacturer: ADE
ADE 6033T Thickness Gauges (ADE Microsense 6033T) MicroSense 6033T * The Model 6033T,using ADE's patented capacitive measurement principle, measures wafers for Thickness and Total Thickness Variation (T...
Rocklin, CA
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Rudolph FE IV Ellipsometer
- used
- Manufacturer: Rudolph
Rudolph FE IV Ellipsometer (FE IV Ellipsometer) Specifications:System: The Rudolph FE III series is a focused beam ellipsometer for simultaneous multi-angle measurements. In addition, multi-wavelength meas...
Rocklin, CA
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ADE 6034 Thickness Gauges
- used
- Manufacturer: ADE
ADE 6034 Thickness Gauges (ADE /Microsense 6034) ADE / Microsense model 6034* Measures: Wafer thickness total, Thickness variation (TTV), Flatness, bow and warp.* Non-contact* Accurate* Digital display* Wid...
Rocklin, CA
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Rudolph Auto EL III Ellipsometer
- used
- Manufacturer: Rudolph
- Model: Auto EL-III
Rudolph Auto EL III Ellipsometer (Rudolph Auto EL III Ellipsomet) Rudolph Auto EL III Ellipsometer EQP-00470* Serial tag info: 24A, Serial # 7367, June 1983* Ellipsometer, 633nm wavel...
Rocklin, CA
Agilent - Keysight 41501B Test & Measurement (semiconductors)
- used
- Manufacturer: Agilent - Keysight
- Model: 41501B
Good condition Agilent - Keysight 41501B Test & Measurement (semiconductors)s available between 2000 and 2005 years. Located in USA and other countries. Click request price for more information.
USA