Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
- Manufacturer: Veeco - Sloan
- Model: Dimension
Nanoscope III SPM and controller LSS large sample scanning stage allows imaging on samples up to 8"x8" with 6"x6" XY travel. Samples up to 1.25" thick Includes 850x optical microscope and fully automated stag...
Veeco - Sloan Dimension Test & Measurement (semiconductors)
- Manufacturer: Veeco - Sloan
- Model: Dimension
Good condition Veeco - Sloan Dimension Test & Measurement (semiconductors)s manufactured in 2006. Located in USA and other countries. Click request price for more information.
USA
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