Used Test & Measurement (Semiconductors) in California, USA

Cascade Probe Card Holder 115-418 for Summit 11XXX and 12XXX series Probers with microchamber

• Manufacturer: Cascade Microtech
• Model: Summit

Cascade Microtechprobe 115-418 card holder for microchamber with clamp holder Back pivoting edge connector Maintains a dark and dry EMI-RFI shielded environment Stable 3 point planarization theta micrometer c...

Zeiss LM100 Inspection Microscope for wafers up to 450mm or flat panels up to 548mmx548mm with motorized stage, brightfield, darkfield, and Nomarski inspection

• Manufacturer: Zeiss
• Model: LM100

Zeiss inspection microscope for large wafers and panels with reflected and transmitted light Brightfield, darkfield, Nomarski (DIC) inspection Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x21.6...

Alessi REL-4100 manual prober with LY1 1064nm laser cutting system

• Manufacturer: Alessi
• Model: REL-4100

Mitutoyo microscope 1064nm pulsed YAG laser Alessi 4100 manual prober with 150mm vacuum chuck and APO 10X objective

Nikon 200mm wafer inspection station with NWL200-TMB (2012) wafer loader and Eclipse L200 microscope

• Manufacturer: Nikon
• Model: NWL200

Nikon 200mm automated inspection system with Eclipse L200 microscope and Nikon NWL200-TMB wafer loader Topside, Macro, backside inspection modes May be configured for 150mm or 200mm wafers. Â Includes shuttle s...

Alessi REL4100 manual prober with 150mm vacuum chuck and 6 positioners

• Manufacturer: Alessi
• Model: REL-4100

B&L Microzoome with 4 objectives (May be upgraded to Mitutoyo FS60) add $5500. including 5x/10x/20x/50 objectives 150mm stainless vacuum chuck Microscope XY positioning Manual Platen lift

Nikon NWL860T wafer loader for 150-200mm wafers

• Manufacturer: Nikon
• Model: NWL860

Nikon wafer loader for 150/200mm wafers Prealignment for wafer flat or notch Shuttle stage additional add $4500.

Nikon Optiphot 150 Inspection Microscope for brightfield, darkfield, and DIC

• Manufacturer: Nikon
• Model: Optiphot 150

Reflected light microscope configured for brightfield, darkfield, and DIC ( Nomarkski) inspection stage has 6x6 xy travel 5 place universal nosepiece CF BD Plan DIC 5x/10x/20x/50x objectives 4 Nomarski prisms...

DCI HM1818 Motorized XY Stage with 18x18 XYTravel

Motorized XY stage with 18"x18" travel Sort: 0

Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage

• Manufacturer: Veeco - Sloan
• Model: Dimension

Nanoscope III SPM and controller LSS large sample scanning stage allows imaging on samples up to 8"x8" with 6"x6" XY travel. Samples up to 1.25" thick Includes 850x optical microscope and fully automated stag...

Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers

• Manufacturer: HSEB

Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...

Nikon Optiphot 300 with reflected and transmitted light and 10x14 XY stage travel

• Manufacturer: Nikon
• Model: Optiphot 300

Configured for Reflected and Transmitted Light Brightfield & Darkfield observation Trinocular Viewing Head 5 place nosepiece with motorized rotation and keypad CF Plan 5x/10x/20x/50x objectives stage with gl...

Nikon DIC motorized polarizer for Optiphot 200/300 with 1/4 wave plate

• Manufacturer: Nikon
• Model: Optiphot 200

Nikon DIC motorized polarizer for Optiphot 200/300 with 1/4 wave plate

Nikon NWL860-TMB-SP wafer loader with Eclipse L200 microscope for 150/200mm wafers with macro and backside inspection

• Manufacturer: Nikon
• Model: NWL860

Nikon Eclipse L200 microscope with 5/10/20/50/100 LU Plan BD objectives for brightfield and darkfield Nikon NWL-860-TMB wafer loader with macro and backside inspection modes Nikon 8x8 shuttle stage Alignment p...

HP 4155A Semiconductor Parameter Analyzer SPA with 4 SMU's +/-100V @ 0.1A ea

• Manufacturer: Agilent - Keysight
• Model: 4155A

Local pickup at "Buy it Now" price will come with 1 yr. warr. NO CORROSION! (ask other sellers to show the analyzer's back panel. Equipment coming from Asia is ALWAYS corroded due to the environmental factors) T...

8K AOI K SERIES

Maximum PCB dimensions 17" x 12.8" & 17" x 23.6" PCB thickness .5 - 4 mm Minimun edge clearence 3mm Dual Lane

KLA-Tencor Surfscan SP1 Test & Measurement (semiconductors)

• Manufacturer: KLA-Tencor
• Model: Surfscan SP1

Good condition KLA-Tencor Surfscan SP1 Test & Measurement (semiconductors)s manufactured in 2006. Located in South Korea and other countries. Click request price for more information.