Nanometrics Nanospec AFT2100 Film Thickness Measurement System
- Manufacturer: Nanometrics
- Model: Nanospec AFT 2100
UPGRADE AVAILABLE TO FLAT PANEL MONITOR ADD $3500. film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator spot size 6...
Rudolph Research FE-III Focus Ellipsometer
- Manufacturer: Rudolph
- Model: FE-III
The FE-III has fully automatic operation and a scanning stage. Unique optical and detection systems measure ellipsometric parameters over an angle range of 40 to 70 degrees simultaneously, giving more flexibility...
San Jose, CA
ADE UltraScan 9300 Wafer Inspection System
- Manufacturer: ADE
Non-contact capacitive probe measurement with 10nm resolution, and 400 to 1000 microns wafer thickness range. It is capable of handling 100mm to 200mm wafers. Features: 2 cassette input stations 3 cassette output...
San Jose, CA
Rudolph Research Auto EL III Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-III
The Rudolph Ellipsometer AutoELIII allows measurement of the thickness and refractive index of one or two thin transparent films on a substrate. Features: Internal data reduction software for single and double la...
San Jose, CA
Rudolph Research Auto EL IV Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-IV
The AutoEl IV has automatic 3 wavelength operation and a scanning stage. Multiple wavelength operation gives this instrument more flexibility for meauring multiple film stacks. The scanning stage allows wafer uni...
San Jose, CA
Rudolph Research FE-IIID Focus Dual Wavelength Ellipsometer
- Manufacturer: Rudolph
The FE III-D's advanced Focused Beam™ system uses dual wavelength technology to directly measure the sample with a small spot at multiple angles of incidence and at multiple wavelengths. This allows the system to...
San Jose, CA
ADE UltraScan 9350 Wafer Inspection / Sorter System
- Manufacturer: ADE
Non-contact capacitive probe measurement with 10nm resolution, 400 to 1000 microns wafer thickness range. Capable of handling 100mm to 200mm wafers Features: 2 cassette input stations, 3 cassette output stations,...
San Jose, CA
KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System set up for 200mm Edge Grip Handler. Cassette Open Handler System/SMIF/Dual Cassette. System refurbished to meet OEM Specifications. Features: Includes the...
San Jose, CA
KLA-Tencor Surfscan 6400 Film Surface Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6400
KLA-Tencor 6400 Surfscan film surface analysis system for detection of contaminating particles. Detects contaminating partciles on all surfaces even rough surfaces. Small particles on dielectrics, polysilicon, ba...
San Jose, CA
KLA-Tencor 6200 Surfscan Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
Wafer surface contamination analyzer for unpatterned wafers. Features: Instantaneous mangified 3-D views of individual defects Color coded defect maps, histograms, and other graphics Surface haze detection Capabl...
San Jose, CA
Electroglas Xynetics 1034X Wafer Prober with Station
- Manufacturer: Electroglas
- Model: 1034X
This tool is designed to provide a high throughput capacity. It features a temptronics 4 inch thermal Chuck and Miller temperature controller. Features: Temptronics 4-inch Thermal Chuck and Miller Temperature Con...
San Jose, CA
KLA-Tencor 7700 Wafer Inspection System (M)
- Manufacturer: KLA-Tencor
Patterned / Unpatterned wafer inspection system. Specifications: 100mm-200mm Wafer Configurable 2 Particle Collection Channels 0.15um Particle Sensitivity Multiscan Capable Automatic Coordinate Registration Rando...
San Jose, CA
KLA-Tencor Model AIT XP Darkfield Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT XP
The KLA-Tencor AIT XP+ Patterned Wafer Inspection system is designed to meet the needs of 0.13um and beyond design rule processes. Based on the highly popular AIT series, the AIT XP+ incorporates Mixed Mode Detec...
San Jose, CA
KLA-Tencor AIT I In-Line Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT I
Automated full water inspection system for detecting particles as small as 0.10 micrometers on bare silicon and patterned process wafers Features: High detection sensitivity even for difficult after-etch, develop...
San Jose, CA
KLA-Tencor Surfscan 5500 Surface Particle Inspection Analyzer
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
Features: Handles high scattering surfaces such as metals, polysilicon, and CVD films. Map locations size available for each particle. Specifications: Can handle from 2" to 8" wafers Submicron sensitivity, detect...
San Jose, CA
KLA-Tencor Surfscan 5500 Test & Measurement (semiconductors)
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
Good condition KLA-Tencor Surfscan 5500 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA
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