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About the KLA-Tencor AIT

The KLA-Tencor AIT is an automated semiconductor inspection system designed to detect and classify wafer defects across front-end manufacturing. Built for production environments, the AIT streamlines inline inspection with fast throughput, repeatable results and integration capabilities for process control and yield improvement.

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Used KLA-Tencor AIT Test & Measurement (Semiconductors) in Meath, Ireland

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