| Application | Semiconductor wafer inspection |
| Technology | Automated optical inspection |
| Compatible wafer sizes | 200,300 |
| Defect sensitivity | sub-micron |
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...
“This unit is missing screws that hold the front panel.” KLA-Tencor 0023935-003 Transformer KLA-Tencor AIT UV+ used working Inventory # AA-6685 This KLA-Tencor 0023935-003 transformer is used working surplus. The...
KLA-Tencor 0099586-001 Laser Servo Detector KLA Instruments AIT Fusion Working Removed from a KLA-Tencor AIT Fusion UV Dark Field Wafer Particle Inspection System This KLA-Tencor 0099586-001 is used working surpl...