Agilent/Keysight 4155B
used
- Manufacturer: Agilent - Keysight
- Model: 4155B
The 4155B Semiconductor Paramer Analyzer is used to evaluate materials with measurements to 1 fA and 1 µV, automatically extract process parameters without manually manipulating screen markers, measures leakage c...
KLA-Tencor 6100 Surfscan Analysis System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6100
Unpatterned wafer surface contamination analyzer Features: Instantaneous magnified 3-D views of individual defects. Color coded defect maps, histograms, and other graphics. Surface haze detection. Specifications:...
San Jose, CA
KLA-Tencor 6200 Surfscan Analysis System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
Wafer surface contamination analyzer for unpatterned wafers. Features: Instantaneous mangified 3-D views of individual defects Color coded defect maps, histograms, and other graphics Surface haze detection Capabl...
San Jose, CA
Agilent/Keysight 4156B
used
- Manufacturer: Agilent - Keysight
- Model: 4156B
Agilent 4155B/4156B is an electronic instrument for measuring and analyzing the characteristics of semiconductor devices. This one instrument allows you to perform both measurement and analysis of measurement res...
KLA-Tencor Surfscan 6400 Film Surface Analysis System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6400
KLA-Tencor 6400 Surfscan film surface analysis system for detection of contaminating particles. Detects contaminating partciles on all surfaces even rough surfaces. Small particles on dielectrics, polysilicon, ba...
San Jose, CA
KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System set up for 200mm Edge Grip Handler. Cassette Open Handler System/SMIF/Dual Cassette. System refurbished to meet OEM Specifications. Features: Includes the...
San Jose, CA
HEWLETT PACKARD 16500C LOGIC ANALYSIS SYSTEM 16500-40502 x3, 16555D Analyzer
used
- Manufacturer: HP
HEWLETT PACKARD 16500C LOGIC ANALYSIS SYSTEM 16500-40502 x3, 16555D Analyzer System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT O...
$1,200 USDSanta Barbara, CA
Agilent/Keysight 4155C
used
- Manufacturer: Agilent - Keysight
- Model: 4155C
The Agilent 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and add...
Agilent/Keysight 4156C
used
- Manufacturer: Agilent - Keysight
- Model: 4156C
The Agilent 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and ad...
- Trusted Seller
KLA SP1 CLASSIC Wafer Surface Analysis WAFER INSPECTION
used
- Manufacturer: KLA-Tencor
- Model: SP1
KLA SP1 CLASSIC Wafer Surface Analysis Surfscan SP1 Classic , KLA Tencor Vintage 1998 Diameter: 300mm, Load port: 300mm FOUP Excellent Condition SP1 Classic Detailed Configuration Clink here Contact:
Bree, Ireland 
Agilent/Keysight 4155A
used
- Manufacturer: Agilent - Keysight
- Model: 4155A
The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range; I: 10 fA to 100 mA (50 fA offset accuracy), V: 1 micro V to 100 V, fully automated I-V sweep measurements with dc or pu...
Agilent/Keysight 4145B
used
- Manufacturer: Agilent - Keysight
- Model: 4145B
The 4145B Semiconductor Parameter Analyzer is able to offer complete dc characterization of semiconductor devices and materials. The 4145B stimulates voltage and current sensitive devices, measures the resulting ...
Cascade Microtech S300 64518
used
- Manufacturer: Cascade Microtech
Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the ...
- Trusted Seller
Rucker & Kolls 666 Prober
used
- Manufacturer: Rucker & Kolls
The R&K 666 is a part of the advanced 600 Series of probers from Rucker & Kolls. This series is based on a universal probing concept for full spectrum evaluation/functional/failure analysis probing capability on ...
Billerica, MA - Trusted Seller
GE Phoenix Analyzer 160kV Nano Focus
used
- Manufacturer: Phoenix
GE Phoenix Analyzer 160kV Nano Focus X-Ray System Vintage: 2005 160kV Open Tube (Filaments) Nano Focus X-Ray Tube 1200X Geometric Magnification Imaging System: Quality Assistane, Real Time, Windows Based, Image A...
St. Petersburg, FL
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