Used processing

Trusted Seller
Nikon 2B002-023 Arched Holder End Effector OPTISTATION 7 300mm Working Spare
- used
- Manufacturer: Nikon
- Model: Optistation VII
“Removed from a Nikon OPTISTATION 7 300mm Automatic Wafer Inspection System” Nikon 2B002-023 Arched Holder End Effector OPTISTATION 7 300mm Working Spare Inventory # A-17931 Removed from a Nikon OPTISTATION 7 300...
$1,007 USD
Albuquerque, NM
Trusted Seller
Hine Design 03365-008 200mm Wafer Indexer Lift Loader Nikon OPTISTATION 3 Spare
- used
- Manufacturer: Nikon
- Model: Optistation III
“Removed from a Nikon OPTISTATION 3 200mm Automatic Wafer Inspection System” Hine Design 03365-008 200mm Wafer Indexer Lift Loader Nikon OPTISTATION 3 Spare Removed from a Nikon OPTISTATION 3 200mm Automatic Wafe...
$503 USD
Albuquerque, NM
Trusted Seller
Qcept QSD-3001.01 ChemetriQ 3000 Wafer Inspection System Operation Manual Spare
- used
- Manufacturer: Qcept Technologies
“Removed from Qcept Technologies ChemetriQ 3000-200M/300M Wafer Inspection System” Qcept QSD-3001.01 ChemetriQ 3000 Wafer Inspection System Operation Manual Spare Inventory # CONG-1806 Removed from Qcept Technolo...
$1,008 USD
Albuquerque, NM
Trusted Seller
Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
- used
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
United States
Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
- used
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States
Trusted Seller
RUDOLPH FE-VII-D, Focus Ellipsometer
- used
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States
ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM
- used
- Manufacturer: Orbotech
INFORMATION: ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM MODEL: FPI-7092 M SERIAL NO: SF 021005 DATE OF MFG: 06-2002 VOLTAGE: 120 VAC AMP: 32A FREQUENCY: 50/60 HZ The Orbotech FPI-7092 System is an AOI ...
Santa Barbara, CA
Trusted Seller
PROCESS PROBE
- used
- Manufacturer: Tara Semiconductor Technology
PROCESS PROBE
Trim, Ireland
Trusted Seller
PROCESS PROBE
- used
- Manufacturer: Tara Semiconductor Technology
PROCESS PROBE
Trim, Ireland
KLA-Tencor Model AIT XP Darkfield Inspection System
- used
- Manufacturer: KLA-Tencor
- Model: AIT XP
The KLA-Tencor AIT XP+ Patterned Wafer Inspection system is designed to meet the needs of 0.13um and beyond design rule processes. Based on the highly popular AIT series, the AIT XP+ incorporates Mixed Mode Detec...
San Jose, CA
Trusted Seller
Altek Process Voltage Analyzer
- used
- Manufacturer: Altek
Trim, Ireland
KLA-Tencor AIT I (8020)
- used
- Manufacturer: KLA-Tencor
- Model: AIT I
A double darkfield patterned wafer inspection tool. Features: Automated wafer inspection system Double-dark field (DDF) laser scanning technology High detection sensitivity even for difficult after-etch, develop,...
San Jose, CA
Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
- used
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
$37,500 USD
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Est. $706/mo
San Jose, CA
KLA-Tencor Surfscan 7700 Wafer Inspection System
- used
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
A patterned and unpatterned wafer inspection and can accommodate wafers between 4" to 8". Features: High sensitivity on after-ech and high topography applications Dual collection channels Circular input polarizat...
San Jose, CA
KLA-Tencor AIT I In-Line Defect Inspection System
- used
- Manufacturer: KLA-Tencor
- Model: AIT I
Automated full water inspection system for detecting particles as small as 0.10 micrometers on bare silicon and patterned process wafers Features: High detection sensitivity even for difficult after-etch, develop...
San Jose, CA