- Trusted Seller
Veeco / Digital Instruments Dimension 3100 Atomic Force Microscope (AFM)
used
- Manufacturer: Veeco - Sloan
- Model: Dimension 3100
- Comes with all necessary components Including: - Upgraded AFM Control Computer with NanoScope V 6.13 Control Software - NanoScope Analysis V 1.5 - Dual 22" Dell Flatscreen Monitors - Digital instruments Tr...
United States 
HEWLETT PACKARD 16500C LOGIC ANALYSIS SYSTEM 16500-40502 x3, 16555D Analyzer
used
- Manufacturer: HP
HEWLETT PACKARD 16500C LOGIC ANALYSIS SYSTEM 16500-40502 x3, 16555D Analyzer System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT O...
$1,200 USDSanta Barbara, CA
Agilent/Keysight 4156B
used
- Manufacturer: Agilent - Keysight
- Model: 4156B
Agilent 4155B/4156B is an electronic instrument for measuring and analyzing the characteristics of semiconductor devices. This one instrument allows you to perform both measurement and analysis of measurement res...
Agilent/Keysight 4155A
used
- Manufacturer: Agilent - Keysight
- Model: 4155A
The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range; I: 10 fA to 100 mA (50 fA offset accuracy), V: 1 micro V to 100 V, fully automated I-V sweep measurements with dc or pu...
Tektronix 4200A-SCS
used
- Manufacturer: Tektronix
- Model: 4200
The 4200A-SCS is a customizable and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization. The hi...
Agilent/Keysight 4156C
used
- Manufacturer: Agilent - Keysight
- Model: 4156C
The Agilent 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and ad...
Agilent/Keysight 4155C
used
- Manufacturer: Agilent - Keysight
- Model: 4155C
The Agilent 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and add...
Agilent/Keysight 4155B
used
- Manufacturer: Agilent - Keysight
- Model: 4155B
The 4155B Semiconductor Paramer Analyzer is used to evaluate materials with measurements to 1 fA and 1 µV, automatically extract process parameters without manually manipulating screen markers, measures leakage c...
Agilent/Keysight 4145A
used
- Manufacturer: Agilent - Keysight
- Model: 4145A
The 4145A Semiconductor Parameter Analyzer performs high speed DC characterization of semiconductor devices and materials automatically, saving you time and money. It has four programmable stimulus/measurement un...
- Trusted Seller
RUDOLPH FE-VII-D, Focus Ellipsometer
used
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States 
KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
used
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CA
Sopra Ellipsometer GXR
used
SOPRA ELIPSOMETER MANUFACTURER: SOPRA MODEL : GXR Description: SOPRA has developed a new approach by combining two non-destructive characterization techniques on the same instrument: Spectroscopic Ellipsometry (S...
Santa Barbara, CA- Trusted Seller
Keysight (Agilent) 4156B
used
- Manufacturer: Agilent - Keysight
- Model: 4156B
Precision Semiconductor Parameter Analyzer Agilent 4155B/4156B is an electronic instrument for measuring and analyzing the characteristics of semiconductor devices. This one instrument allows you to perform both ...
Cary, NC - Trusted Seller
Keysight (Agilent) 4155A
used
- Manufacturer: Agilent - Keysight
- Model: 4155A
Semiconductor Parameter Analyzer The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range; I: 10 fA to 100 mA (50 fA offset accuracy), V: 1 micro V to 100 V, fully automated I-V...
Cary, NC 
KLA-TENCOR SURFSCAN 6200/6220 (SFS 6200/6220)
refurbished
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
KLA-Tencor Surfscan 6200/6220 (SFS 6200/6220) Wafer Surface Contamination Analysis System The SFS 6200/6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is ...
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