1997 Schmitt Measurement System TMS 2000
used
- Manufacturer: Schmitt Measurement System
AS-IS Wafer size: 6" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
1994 KLA TENCOR SFS 6200
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...
Cheonan-si, South Korea
NIKON Nikon Eclips L200 + NWL641
used
- Manufacturer: Nikon
- Model: NWL641
Nikon Eclips L200 - Motorize objectives Nikon NWL641 autoloader - Orientation flat/notch detection
Cheonan-si, South Korea
BIO-RAD QS-300
used
- Manufacturer: Bio-Rad
- Model: QS-300
BIO-RAD FT-IR QS-300 Spectrometer .FTS40 Spectrometer - He-Ne Laser - IR Source - DTGS Detector - KBr Beam Splitter .Up to 8 Inch, Wafer Tray/Nose Cone .FTS Power Supply .Windows XP PC & LCD Monitor .EPI,BPSG, C....
Cheonan-si, South Korea
2000 KLA TENCOR AIT AIT XP+(Fusion)
used
- Manufacturer: KLA-Tencor
- Model: AIT XP
[ System Configuration ] . CE marked . Single open cssette handler . Image Computer . (3) Collection Channels . Spot Size 7um, 5um, 3.5um . Internal Microscope Review - Microscope review Objectives 10x, 50x, 100x...
Cheonan-si, South Korea
1996 VEECO Dimension 7000
used
- Manufacturer: Veeco - Sloan
- Model: Dimension 7000
As-Is, 8" Automatic AFM tool Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2017 KLA TENCOR P-17
used
- Manufacturer: KLA-Tencor
[Features] - Microhead 5-xr (13, 131, 1048 um range) - Objective lens : 6.4x, Magnification range : 173x~750x - Scan full diameter of the sample without stitching for bow and film stress measurement - Fully motor...
Cheonan-si, South Korea
2010 SDI/SEMILAB MCV2500
used
- Manufacturer: Semilab
■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ CDA: 8...
Cheonan-si, South Korea
SDI/SEMILAB FAaST 200 SL
used
- Manufacturer: Semilab
- Model: FAAST 200 SL
non-contact electrical C-V & I-V measurement system capable of measuring on product wafers. Measurements can be made in scribe line test sites or in the active cell area. Cell measurements allow for the first ti...
Cheonan-si, South Korea
2006 N&K NK5300
used
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Cognex Pattern Recognition Software n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unload...
Cheonan-si, South Korea
2007 N&K N&K Little foot 8000 CD
used
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Reflectance, Polarized Cognex Pattern Recognition Software Windows 7 Operating System n&k's Thin Film Characterization S/W n&k's Sta...
Cheonan-si, South Korea
2005 KLA TENCOR OSA6100
used
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
2006 KLA TENCOR OSA6100
used
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
N&K N&K 1700
used
- Manufacturer: N&K
*. Film Thickness and Trench profile measurement. *. Manual load Metrology system. *. Simultaneously determine thickness, n and k in the spectral range of 190-1000nm, trench profile and provide non-destructive, r...
Cheonan-si, South Korea
1996 NANOMETRICS 2100
used
- Manufacturer: Nanometrics
- silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon 500~ 40,000 A. - other thin films. *. Hardware configuration: - Optical microscope & objectives 5x,10x,40x. - Spectrophotometer Head. - Microc...
Cheonan-si, South Korea
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