SDI/SEMILAB FAaST 230
used
- Manufacturer: Semilab
- Model: FAAST 230
. Up to 8" . Automatic robotic wafer handling . Single open-cassette wafer loading station . Measurement of dielectric and interface properties on monitor wafer - Dielectric Capacitance (CD) and Thickness (EOT) -...
Cheonan-si, South Korea2009 SDI/SEMILAB WT-2000PV
used
- Manufacturer: Semilab
- Model: WT-2000PV
■ System Configuration . WT2000PV main unit with scanning capability . Sample stage (Max wafer size 200mm) . μ-PCD head for lifetime measurements . Vacuum pump . Utility : ■ Hadware Function Capability . μ-PCD me...
Cheonan-si, South Korea2018 SDI/SEMILAB WT-2020
used
- Manufacturer: Semilab
■ System Configuration . WT2020 main unit with scanning capability . μ-PCR head for lifetime measurements . Vacuum pump . Utility : ■ Hadware Function Capability . μ-PCD measurement (904 nm Laser) . Laser Power F...
Cheonan-si, South KoreaN&K OptiPrime - CD
used
- Manufacturer: N&K
Key Qualities of OptiPrime - CD ■ Optimized Polarized Reflectance (Rs and Rp) Data - Micro-Spot Technology ■ Can be Configured for 300 mm (12”), 200 mm (8”),and 150 mm (6”) Wafers ■ Fully Automated ■ Based on Pat...
Cheonan-si, South Korea2010 KLA TENCOR Candela CS20
used
- Manufacturer: KLA-Tencor
- Model: CANDELA CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea1997 Schmitt Measurement System TMS 2000
used
- Manufacturer: Schmitt Measurement System
AS-IS Wafer size: 6" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea1994 KLA TENCOR SFS 6200
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...
Cheonan-si, South KoreaNIKON Nikon Eclips L200 + NWL641
used
- Manufacturer: Nikon
- Model: NWL641
Nikon Eclips L200 - Motorize objectives Nikon NWL641 autoloader - Orientation flat/notch detection
Cheonan-si, South KoreaBIO-RAD QS-300
used
- Manufacturer: Bio-Rad
- Model: QS-300
BIO-RAD FT-IR QS-300 Spectrometer .FTS40 Spectrometer - He-Ne Laser - IR Source - DTGS Detector - KBr Beam Splitter .Up to 8 Inch, Wafer Tray/Nose Cone .FTS Power Supply .Windows XP PC & LCD Monitor .EPI,BPSG, C....
Cheonan-si, South Korea2000 KLA TENCOR AIT AIT XP+(Fusion)
used
- Manufacturer: KLA-Tencor
- Model: AIT XP
[ System Configuration ] . CE marked . Single open cssette handler . Image Computer . (3) Collection Channels . Spot Size 7um, 5um, 3.5um . Internal Microscope Review - Microscope review Objectives 10x, 50x, 100x...
Cheonan-si, South Korea1996 VEECO Dimension 7000
used
- Manufacturer: Veeco - Sloan
- Model: Dimension 7000
As-Is, 8" Automatic AFM tool Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea2017 KLA TENCOR P-17
used
- Manufacturer: KLA-Tencor
[Features] - Microhead 5-xr (13, 131, 1048 um range) - Objective lens : 6.4x, Magnification range : 173x~750x - Scan full diameter of the sample without stitching for bow and film stress measurement - Fully motor...
Cheonan-si, South Korea1999 VEECO VEECO Detak V200-SL
used
- Manufacturer: Veeco - Sloan
As-Is Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea1998 PROMETRIX RS35
used
- Manufacturer: PROMETRIX
*. Measurement perfomance: - 4 Point Probe check surface on Silicon wafer - Measurement range 5 Megohm/sq - Routine check 1-30 sites programmable - Counter/ 3-D map, Diameter scan 49,81,121,225,361,441,625 site...
Cheonan-si, South Korea2002 KLA TENCOR P-15
used
- Manufacturer: KLA-Tencor
- Model: P-15
- Long Scan Profiler P-15 Measurement. - Micro Head II SR - Pentium III 733MHz, Ram 256MB & 19" LCD Color Monitor, Windows NT 4.0 - Installed in Clean-room. - Can demonstrate any time.
Cheonan-si, South Korea