Viavi JDSU OLTS-85P Fiber Optic Loss Test Set & Microscope 2326/15 SM MM QUAD
- Manufacturer: JDSU - Viavi - Acterna
Used Supplied as pictured with a carry bag and power adapter and additional accessories. Included in the sale: 2x OLTS 85P Patchcords 2x LC connectors Carry bag power adapters Please refer to the manufacturer's w...
$2,793 USDBlackburn, United KingdomAFL USB Digital Fiber Inspection probe
- Manufacturer: Noyes
The DFS1 is available in three different kits which provide either PC/UPC adapters, APC adapters, or no adapters. All kits include soft carry case, a storage box to hold up to six adapter tips, FiberScope display...
Gatineau, Canada- Trusted Seller
Semicaps Inverted Analytical and Tester-Docked Scanning Optical Microscope System
- Manufacturer: Unknown
Semicaps Inverted Analytical and Tester-Docked Scanning Optical Microscope System Inverted Analytical and Tester-Docked Scanning Optical Microscope System
Bree, Ireland - Trusted Seller
BAUSCH & LOMB StereoZoom 4 Microscope
- Manufacturer: Bausch & Lomb
- Model: Stereozoom 6
Microscope, 0.67-4.0X with WF 10X/21 Eyepieces
Trim, Ireland - Trusted Seller
BAUSCH & LOMB StereoZoom 6-ST Microscope
- Manufacturer: Bausch & Lomb
- Model: Stereozoom 6
Microscope on Boom Stand, 0.67-4X with 10X W.F. Stereo Eyepieces
Trim, Ireland - Trusted Seller
WENTWORTH MP-2300
- Manufacturer: Wentworth
- Model: MP-2300
WENTWORTH MP-2300 Probe tool to be used with electrical tester 300 mm Vintage
Bree, Ireland Nikon MM-60/L3T
- Manufacturer: Nikon
Product name: microscope | Main specifications: MM-60/L3T Measuring Microscope
Tokigawa, JapanNikon [Measuring Microscope] MM-60
- Manufacturer: Nikon
Product name: microscope | Main specifications: Binocular Stroke X200:Y150 Digital SC-213 Rotary Table Universal | Current status: recommendation
Tokigawa, JapanSEMICAPS 3000
SEMICAPS 3000 An inverted microscope system that is a tester dockable Features & Capabilities For backside analysis of wafers, wafer parts and packaged devices. Able to dock with ATE platforms Easily moved from T...
SingaporeSEMICAPS 5000
SEMICAPS 5000 A full analytical direct tester-docked wafer prober system Features & Capabilities Wafer analysis using a combination of Laser Timing Probe (LTP), Scanning Optical Microscope (SOM) and Photon Emissi...
SingaporeSEMICAPS 4000
SEMICAPS 4000 An inverted system that is both analytical and tester dockable Features & Capabilities Analytical or ATE docked configuration 300 mm wafer stage including auto-lock compatible with Probe Cards and m...
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Scanning Optical Microscopy A multi-laser scanning optical microscope system for the active localization of integrated circuit defects by using static power alteration and dynamic tester-based techniques Features...
SingaporeThermal Microscopy
Thermal Microscopy Thermographic capturing system can pinpoint MWIR emissions within a semiconductor device. It can locates thermal hotspots arising from a variety of defects. It can be integrated into any of the...
Singapore