HGTECH Defect Detection Series Semiconductor Substrate Defect Detection Equipment
new
- Manufacturer: Hgtech
Product advantages: Suitable for 4-8 inch wafers, substrates, epitaxial wafers and patterned wafers Detect particles, pits, bumps, scratches, stains, cracks and other defects System resolution: 1-10 μ m No patter...
Wuhan, China
HGTECH Wafer Defect Detection Series Semiconductor Wafer Defect Detection Equipment
new
- Manufacturer: Hgtech
Product advantages: This equipment can be used for 4-8 inch patterned wafers Detect defects such as scratch, back collapse, color difference, crack, scratch, metal residue and metal loss System resolution: 0.2-0....
Wuhan, China
V510i R Advanced 3D Optical Inspection (AOI)
new
Revolutionary Advanced Optical Inspection (AOI) platform with integrated 6-axis industrial robotic arm, providing flexibility for multi-angle inspection. It is the pioneer AOI platform that provides flexible 2-in...
Shenzhen, China
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