- Trusted Seller
Signatone CM-465-22
- Manufacturer: Signatone
- Model: CM-465-22
Status of Equipment: De-installed Process Type: Wafer Probes Signatone CM460-22 semiautomatic probe station which includes / SIGNATONE WL210 / Vibration Isolation Table /Monitor Mount, KEITHLEY 2636B SOURCE MET...
United States - Trusted Seller
Advantest T2000 LS
- Manufacturer: Advantest
- Model: T2000LS
T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (1) BPS-034491 PMU32 Condition Good Working Condition/Off-Line Configuration T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | ...
United States - Trusted Seller
2007 KLA Candela CS 20 Wafer Inspection
- Manufacturer: KLA-Tencor
KLA Candela CS 20 Wafer Inspection - 1 Phase - 50/60 Hz - 115 V 2007 Vintage
United States - Trusted Seller
Veeco / Digital Instruments Dimension 3100 Atomic Force Microscope (AFM)
- Manufacturer: Veeco - Sloan
- Model: Dimension 3100
- Comes with all necessary components Including: - Upgraded AFM Control Computer with NanoScope V 6.13 Control Software - NanoScope Analysis V 1.5 - Dual 22" Dell Flatscreen Monitors - Digital instruments Tr...
United States - Trusted Seller
2004 KLA- Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
- Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Already upgraded with ENH SS laser - Defect Map and Histogram with Zoom - RTDC (Real Time Defect Class...
United States - Trusted Seller
NIKON NWL860-TMB-SP
- Manufacturer: Nikon
- Model: NWL860
Nikon Eclipse L200 microscope with 5/10/20/50/100 LU Plan BD objectives for brightfield and darkfield Nikon NWL-860-TMB wafer loader with macro and backside inspection modes Nikon 8x8 shuttle stage Alignment p...
United States - Trusted Seller
KLA-Tencor SP 1 TBI Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
- 3 Ports: 200 mm / 300 mm - Refurbished
United States - Trusted Seller
1992 KLA-Tencor Surfscan 6200 Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
The KLA is complete and refurbished in 2015. No known condition issues.
United States - Trusted Seller
KLA AIT II system
- Manufacturer: KLA-Tencor
- Model: AIT II
Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...
United States - Trusted Seller
1995 KLA-Tencor Surfscan 6200
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
Type: Wafer Surface Analysis System
United States - Trusted Seller
United States - Trusted Seller
United States - Trusted Seller
1997 KLA AIT I Main System
- Manufacturer: KLA-Tencor
- Model: AIT I
Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...
United States - Trusted Seller
KLA-TENCOR Surfscan 5500
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haze detected as low as 0.3 ppm. - Handles high scattering surfaces such as ...
United States - Trusted Seller
Signatone S-M90
- Manufacturer: Signatone
- Model: S-M90
Process Type: Wafer Probes Status of Equipment: De-installed Includes Signatone WL170 RF Manual ProbeStation with SanjSCOPE™ EZ-THERM Lock-In Thermal Imaging System
United States 
Agilent - Keysight 16058A Test & Measurement (semiconductors)
- Manufacturer: Agilent - Keysight
- Model: 16058A
Good condition Agilent - Keysight 16058A Test & Measurement (semiconductors)s available between 1990 and 1995 years. Located in USA and other countries. Click request price for more information.
USA
Tip: Enter manufacturer, model or keyword