- Trusted Seller
KLA-Tencor Prism Lens with WFR Adjuster Set of 2 GPIO Laser Optics AIT I Used
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-Tencor Prism Lens with WFR Adjuster Set of 2 GPIO Laser Optics AIT I Used Inventory # 16313 This KLA-Tencor Prism Lens with WFR Adjuster Set of 2 GPIO Laser Optics AIT I is used working surplus. The physical ...
$603 USDAlbuquerque, NM - Trusted Seller

Signatone CM460-22
- Manufacturer: Signatone
- Model: CM-460-22
Signatone CM460-22 semiautomatic probe station 150mm wafer chuck probe card holder joystick controller XY linear motor drive for chuck manual XY microscope translation Mitutoyo FS60 microscope with fiber l...
United States - Trusted Seller

KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States - Trusted Seller

PLASMOS SD 4003 200mm Automated Ellipsometer AF-750 Lang MCC 12 + MP 4000 As-Is
- Manufacturer: Plasmos
- Part No: SD 4003 - Model No: SD 4000 - Configured for wafers up to 200mm - SD Version: 6.25A - Input: 230V, 50/60Hz - Sold As-Is Included Components - System Control Computer - Lang Controller Part No: MCC 12...
United States - Trusted Seller

Advantest T2000 LS
- Manufacturer: Advantest
- Model: T2000LS
T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (1) BPS-034491 PMU32 Condition Good Working Condition/Off-Line Configuration T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | ...
United States - Trusted Seller

2007 KLA Candela CS 20 Wafer Inspection
- Manufacturer: KLA-Tencor
KLA Candela CS 20 Wafer Inspection - 1 Phase - 50/60 Hz - 115 V 2007 Vintage
United States - Trusted Seller

2004 KLA- Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
- Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Already upgraded with ENH SS laser - Defect Map and Histogram with Zoom - RTDC (Real Time Defect Class...
United States - Trusted Seller

NIKON NWL860-TMB-SP
- Manufacturer: Nikon
- Model: NWL860
Nikon Eclipse L200 microscope with 5/10/20/50/100 LU Plan BD objectives for brightfield and darkfield Nikon NWL-860-TMB wafer loader with macro and backside inspection modes Nikon 8x8 shuttle stage Alignment p...
United States - Trusted Seller

KLA-Tencor SP 1 TBI Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
- 3 Ports: 200 mm / 300 mm - Refurbished
United States - Trusted Seller

1992 KLA-Tencor Surfscan 6200 Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
The KLA is complete and refurbished in 2015. No known condition issues.
United States - Trusted Seller

KLA AIT II system
- Manufacturer: KLA-Tencor
- Model: AIT II
Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...
United States - Trusted Seller

1995 KLA-Tencor Surfscan 6200
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
Type: Wafer Surface Analysis System
United States - Trusted Seller
United States - Trusted Seller

1997 KLA AIT I Main System
- Manufacturer: KLA-Tencor
- Model: AIT I
Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...
United States - Trusted Seller

KLA-TENCOR Surfscan 5500
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haze detected as low as 0.3 ppm. - Handles high scattering surfaces such as ...
United States 
Tektronix 177 Test & Measurement (semiconductors)
- Manufacturer: Tektronix
- Model: 177
Good condition Tektronix 177 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA

