- Yongin-si, South Korea
- Yongin-si, South Korea
- Yongin-si, South Korea
AMAT DR SEMVision Cx
used
- Manufacturer: Amat
- Model: Semvision
SEMIVISION cX Defect review Sys including Color MPSI for Enchanced Topography & Material Information
Yongin-si, South Korea- Yongin-si, South Korea
- Yongin-si, South Korea
- Yongin-si, South Korea
NANOMETRICS 9-7200-0195E
used
- Manufacturer: Nanometrics
- Model: 9-7200-0195E
Mask & Wafer Inspection Wafer size: 8"
Yongin-si, South Korea- Yongin-si, South Korea
- Yongin-si, South Korea
- Yongin-si, South Korea
- Yongin-si, South Korea
Accretech WW1500
used
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
Defect Inspection (Bright Field) Wafer size: 300mm
Yongin-si, South Korea- Yongin-si, South Korea
- Yongin-si, South Korea