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Agilent/Keysight PD1550A
- Manufacturer: Agilent - Keysight
The JEDEC standards recognized the need to provide WBG standards for the power semiconductor industry. In September of 2017, the JC70 Wide Bandgap Power Electronic Conversion Semiconductor committee was formed fo...
Farmingdale, NJAgilent/Keysight PD1500A
- Manufacturer: Agilent - Keysight
The JEDEC standards recognized the need to provide WBG standards for the power semiconductor industry. In September of 2017, the JC70 Wide Bandgap Power Electronic Conversion Semiconductor committee was formed fo...
Farmingdale, NJAgilent/Keysight B1505A
- Manufacturer: Agilent - Keysight
- Model: B1505A
The Agilent B1505A Power Device Analyzer / Curve Tracer is the only single box solution available today with the capability to characterize high power devices from the sub-picoamp level up to 3000 volts and 40 am...
Module-Level Burn-in
Input/ output options: JEDEC Tray | Selection of packages: Silicon Carbide (SiC), Gallium Nitride (GaN) Power devices | Channel number: Up to 720 power device burn-in test parallelism | Burn-in duration: Program...
Penang, MalaysiaDie-Level Test
Input options: Waffle Pack, Wafer Ring, De-Taper | Output options: Waffle Tray, Wafer Reconstruction, Tape & Reel | Package type: Die | Test capabilities: AC Test, DC Test, UIS Test at ambient to hot temperature
Penang, MalaysiaFinal Inspection
Power Module Final Inspection HandlerIt offers advanced final inspection solutions for 2D Pin position, 3D pin height inspection and cosmetic inspection for power modules before packing them into trays or plastic...
Penang, MalaysiaPin Insertion
Pin Insertion HandlerIt is capable of processing any manufacturers reeled thru-hole or press-fit products with real time insertion force monitoring and caters to multiple types of pins depending on requirements.
Penang, MalaysiaModule-Level Final Test
Input/ output options: Metal Tray, Blister Tray, Plastic Tube Stacker | Selection of packages: Plastic Case Power Modules, Double-side cooling power module (DSC) | Ambient/hot temperature test: Ambient Temperatu...
Penang, MalaysiaDBC/AMB Substrate-Level Test
Input/ output option: Slot Magazine | Package type: DBC Substrate, AMB Substrate | Ambient/hot temperature test: Ranging from 25°C to 175°C | Temperature control & features: (25°C to 175°C) | Soak time: >90s bas...
Penang, MalaysiaWafer-Level Burn-in
Chuck quantity: Octa Chuck | Package type: Silicon Carbide (SiC) Power Device | Wafer size: 6, 8 inch | Input/ output option: Wafer Cassette (Up to 2 cassettes) | Die per wafer burn-in parallelism: 4000 | Total ...
Penang, MalaysiaWafer-Level Inspection
SiC & GaN Wafer-Level AOI HandlerTrooper-V is Pentamaster’s next level high speed AOI handler designed for wafer-level packages. With quality objective lens, it allows for different levels of magnification to acc...
Penang, MalaysiaDiscrete-Level Test
Input options: Vibrator Bowl, Plastic Tube Stacker | Output options: Tape & Reel, Plastic Tube Stacker | Test capabilities: Electrical Functional Test, Open Short Test, Insulation test | Test site: Dual Test Sit...
Penang, Malaysia
Keysight-Agilent B1505A
- Manufacturer: Agilent - Keysight
Keysight-Agilent B1505A Details Keysight-Agilent B1505A Power Device Analyzer / Curve Tracer The Agilent B1505A Power Device Analyzer / Curve Tracer is the only single box solution available today with the capabi...
Lake Mary, FL
2011 KLA TENCOR Candela 8600
- Manufacturer: KLA-Tencor
- Model: Candela 8600
KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8600
- Manufacturer: KLA-Tencor
- Model: Candela 8600
KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...
Cheonan-si, South Korea
