Building Filters
Signatone S-1160MW-D6 64403
- Manufacturer: Signatone
Signatone S-1160MW-D6 Manual 6" Analytical Wafer Prober. Manual Probe System designed for reliable and accurate analytical testing of DC, CV-IV, and High-Power applications. Ease of use, single-handed X-Y Stage k...
- Trusted Seller
2012 Advantest T6373 ND3
- Manufacturer: Advantest
- Model: T6373 ND3
Inspection Available Yes Description Working Condition ND3 Test Systems. (2) Available Condition Excellent PIN CONFIGURATION MAINFRAME : 1 ‐ 256 TH1 [CTD ] : 1 ‐ 256 LCD : 1 ‐ 2048 RVS : 1 ‐ 64 DPU CONFIG...
United States - Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States 
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
- Trusted Seller
KLA-TENCOR Surfscan Un-Patterned Wafer Surface Inspection
- Manufacturer: KLA-Tencor
- Model: Surfscan 4500
Fully Refurbished & Calibrated TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Suppl...
Trim, Ireland - Trusted Seller
Reticle Inspection
- Manufacturer: Unknown
Tool Condition: tool is power off and installed in the cleanroom. STANDARD SPECIFICATIONS DESCRIPTION Main PC- Included x1 Keyboard & Mouse- Included x1 UPS- Included x1 Fully automated particle measurement modul...
Bree, Ireland - Trusted Seller
1996 KLA TENCOR Surfscan 6420
- Manufacturer: KLA-Tencor
- Model: Surfscan 6420
Automatic Surface Inspection System ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Thro...
Europe - Trusted Seller
1996 KLA Tencor Surfscan 6420
- Manufacturer: KLA-Tencor
- Model: Surfscan 6420
›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ...
Europe - Trusted Seller
1996 KLA Tencor Surfscan 6420
- Manufacturer: KLA-Tencor
- Model: Surfscan 6420
›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ...
Europe - Trusted Seller
LAM 716-013935-118
- Manufacturer: Lam Research - Novellus
LAM 716-013935-118 INSR,BAFL, UV SHLD, 2300 MW ST 30 day parts warranty on all new parts. Available 2017
Bree, Ireland - Trusted Seller
KLA-Tencor Corp Surfscan SP1 DLS Particle Measurement
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-Tencor Corp. Surfscan SP1 DLS Particle Measurement Currently Configured for 300mm wafer size EQUIPMENT DETAILS: Laser Wavelength：488nm Laser Power：75mW Normal Incidence（90 degree）：77nm Oblique Incidence（20 de...
Bree, Ireland - Trusted Seller
Advantest T6671E
- Manufacturer: Advantest
- Model: T6671E
Advantest T6671E Test system Vintage late 1990s BICMOS2-384CH single station prober Timing generator is a 6TE/Pin 32TS Test station with control panel STE Vector 16mw Data fail memory 256W 2 bits/pin Includes the...
Trim, Ireland - Trusted Seller
1994 KLA Surfscan 6200 Particle Counter
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
8" - 0.1 micron Defect Sensitivity (PSL STD) - 0.02 ppm Haze Sensitivity - 0.002 ppm Haze Resolution - Accuracy within 1% - XY coordinates - Lock Down accessories - Tencor approved blower assembly - 30mW ...
Asia 
2011 KLA TENCOR Candela 8600
- Manufacturer: KLA-Tencor
- Model: Candela 8600
KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8600
- Manufacturer: KLA-Tencor
- Model: Candela 8600
KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...
Cheonan-si, South Korea