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Hitachi REM S806
- Manufacturer: Hitachi
- Model: S-806
Hitachi Scanning Electron Microscope S806. With large specimen chamber. With Thermo/Noran EDX system Six. Detector nitrogen-cooled. Company: Hitachi Model: REM S806 Comment: German documents. Hitachi REM S806 Sco...
Burladingen, Germany - Trusted Seller

Teradyne J750 Tester 320 Channels
- Manufacturer: Teradyne
- Model: J750
Teradyne J750 Tester Configuration General Information Manufacturer: Teradyne Manufactured date: Model: J750 Test System I/O Channels: 320 *If requires, available to upgrade 512 Status: Working at present Inspect...
Trim, Ireland - Trusted Seller

Advantest T6671E
- Manufacturer: Advantest
- Model: T6671E
Advantest T6671E Test system Vintage late 1990s BICMOS2-384CH single station prober Timing generator is a 6TE/Pin 32TS Test station with control panel STE Vector 16mw Data fail memory 256W 2 bits/pin Includes the...
Trim, Ireland 
SP3100 Solder Paste Inspection System
SP3100 is a pre-programmed SMT solder paste printing Automatic Optical Inspection (AOI) system. It is equipped with a multi-angle RGBW illumination system, dual low-angle projection modules, a high-resolution ind...
Shenzhen, China
HGTECH Defect Detection Series Semiconductor Substrate Defect Detection Equipment
- Manufacturer: Hgtech
Product advantages: Suitable for 4-8 inch wafers, substrates, epitaxial wafers and patterned wafers Detect particles, pits, bumps, scratches, stains, cracks and other defects System resolution: 1-10 μ m No patter...
Wuhan, China
HGTECH Wafer Defect Detection Series Semiconductor Wafer Defect Detection Equipment
- Manufacturer: Hgtech
Product advantages: This equipment can be used for 4-8 inch patterned wafers Detect defects such as scratch, back collapse, color difference, crack, scratch, metal residue and metal loss System resolution: 0.2-0....
Wuhan, China
