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Used etch

  • ADE UltraScan 9350 Wafer Inspection

    ADE UltraScan 9350 Wafer Inspection / Sorter System

    • used

    • Manufacturer: ADE

    Non-contact capacitive probe measurement with 10nm resolution, 400 to 1000 microns wafer thickness range. Capable of handling 100mm to 200mm wafers Features: 2 cassette input stations, 3 cassette output stations,...

    San Jose, CA
  • Trusted Seller
    KLA AIT II system

    KLA AIT II system

    • used

    • Manufacturer: KLA-Tencor
    • Model: AIT II

    Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...

    United States
  • Trusted Seller
    Rudolph AXI-S

    Rudolph AXI-S

    • used

    • Manufacturer: Rudolph
    • Model: AXI

    Macro Wafer Inspection Wafer size: 12" [As-is] 2x Brooks Loader

    Trim, Ireland
  • Trusted Seller
    Tencor Surfscan 7700M

    Tencor Surfscan 7700M

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 7700

    Tencor Surfscan 7700M (Surfscan 7700) Patterned Wafer Inspection System. Can detect defects as small as 0.15 ¿m, while defects below 0.2 ¿m can be detected on many process levels, inc...

    Rocklin, CA
  • KLA-Tencor AIT I (8020)

    KLA-Tencor AIT I (8020)

    • used

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    A double darkfield patterned wafer inspection tool. Features: Automated wafer inspection system Double-dark field (DDF) laser scanning technology High detection sensitivity even for difficult after-etch, develop,...

    San Jose, CA
  • KLA-Tencor AIT I In-Line Defect

    KLA-Tencor AIT I In-Line Defect Inspection System

    • used

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    Automated full water inspection system for detecting particles as small as 0.10 micrometers on bare silicon and patterned process wafers Features: High detection sensitivity even for difficult after-etch, develop...

    San Jose, CA
  • Trusted Seller
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    KLA Tencor F5X

    • used

    • Manufacturer: KLA-Tencor
    • Model: F5X

    The ASET-F5x thin film metrology system can measure materials across a continuous wavelength spectrum from 190 nm to 800 nm—a critical feature for meeting the stringent thin film measurement requirements down to ...

    Grapevine, TX
  • Trusted Seller
    FEI Company Strata DB 235

    FEI Company Strata DB 235

    • used

    • Manufacturer: FEI
    • Model: STRATA DB 235

    FEI Company Strata DB 235 DualBeam FIB/SEM EQUIPMENT DETAILS: DescriptionRemarks Base FIB SystemFEI Dual Beam 235 Vintage Serial Number10101 Single or Dual Beam Ion ColumnDual Beam system Beam Energy30Kv Laser In...

    Bree, Ireland
  • Trusted Seller
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    Nikon Optiphot66

    • used

    • Manufacturer: Nikon
    • Model: Optiphot 66

    Microscope

    Trim, Ireland
  • Trusted Seller
    no-image_en.png

    Nikon Optiphot66

    • used

    • Manufacturer: Nikon
    • Model: Optiphot 66

    Microscope

    Trim, Ireland
  • Trusted Seller
    no-image_en.png

    Nikon Optiphot66

    • used

    • Manufacturer: Nikon
    • Model: Optiphot 66

    Microscope

    Trim, Ireland
  • Trusted Seller
    no-image_en.png

    Nikon Optiphot 150S

    • used

    • Manufacturer: Nikon
    • Model: Optiphot 150

    Microscope

    Trim, Ireland
  • Trusted Seller
    no-image_en.png

    Rudolph Axi-S

    • used

    • Manufacturer: Rudolph
    • Model: AXI

    Defect Inspection

    Trim, Ireland
  • Trusted Seller
    no-image_en.png

    Nikon Optiphot66

    • used

    • Manufacturer: Nikon
    • Model: Optiphot 66

    Microscope

    Trim, Ireland
  • Trusted Seller
    no-image_en.png

    Nikon Optiphot66

    • used

    • Manufacturer: Nikon
    • Model: Optiphot 66

    Microscope

    Trim, Ireland
12

Overview

Semiconductor inspection and test equipment are specialized machines used to ensure the quality and functionality of semiconductor devices. These machines perform various tests and inspections, including visual inspection, electrical testing, and defect analysis, to identify and address any issues in the semiconductor manufacturing process. They are crucial in maintaining the high standards required in the semiconductor industry.

FAQ

What factors should I consider when buying semiconductor inspection and test equipment?

Consider the equipment's compatibility with your existing systems, the types of tests it performs, its accuracy, and the manufacturer's support and service options. Also, evaluate its overall condition and any included software or accessories.

How can I ensure safe shipping of semiconductor inspection and test equipment?

Use a specialized transport service experienced in handling delicate and high-value equipment. Ensure the equipment is properly packaged, secured, and insured during transit.

What maintenance is required for semiconductor inspection and test equipment?

Regular maintenance includes cleaning, calibration, and software updates. Follow the manufacturer’s guidelines for specific maintenance intervals and procedures to ensure optimal performance and longevity of the equipment.