Building Filters
- Trusted Seller

RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States 
KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CA
Tektronix 576
- Manufacturer: Tektronix
- Model: 576
Details The Tektronix 576 is a high-voltage curve tracer designed for advanced semiconductor testing. It supports up to 1,500V collector supply, pulse and continuous testing modes, and multiple measurement format...
Dublin, Ireland
Tektronix 370
- Manufacturer: Tektronix
- Model: 370
Details The Tektronix 370 Curve Tracer provides precise testing and analysis of semiconductors and transistors with a 2,000V collector supply and 10A pulse current capability. Equipped with high-resolution CRT di...
Dublin, Ireland
Keysight Technologies E5263A
- Manufacturer: Agilent - Keysight
- Model: E5263A
Details The Keysight (Agilent) E5263A 2ch IV Analyzer offers precise current-voltage measurements with dual-channel SMUs, supporting ranges from 5 pA to 1 A and 100 µV to 200 V. It includes EasyEXPERT group+ soft...
Dublin, Ireland
