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Zeiss LM100
- Manufacturer: Zeiss
- Model: LM100
Zeiss LM100 Microscope Large Panel Inspection Tool Zeiss large panel inspection and CD (critical dimension measurement) tool with laser autofocus Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x2...
United States - Trusted Seller

KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States - Trusted Seller

2019 TSK UF3000 EX prober
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000EX
De-Installed. It was in Working Condition. Wafer : 12 Inches. Vintage : 2019. It's complete with HDD and Software included. Configuration : - 12" Nickel Tri-Temp Chucktop - Tokyo Seimitsu Accretech ARTS-HS...
United States - Trusted Seller

RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States - Trusted Seller

2011 KOH YOUNG KY8030-3 3D SOLDER PASTE INSPECTION
- Manufacturer: Koh Young
- Model: KY8030-3
Koh Young Technology KY8030-3 3D Solder Paste Inspection (2011) - Brand: Koh Young Technology - Model: KY8030-3 - Serial Number: SPI-83L215 - Power: 220V a.c - Year of Manufacture: 2011 - Type: 3D SPI FEATURES: -...
El Paso, TX - Trusted Seller

2000 Teradyne, Inc. Catalyst Mixed Signal
- Manufacturer: Teradyne
- Model: Catalyst
Teradyne Catalyst TESTER ID : CAT-004 Model : CATALYST MIXED SIGNAL Manufacturer : Teradyne Serial No. : 0027H256 Date Released : 15/09/00 COMPUTER HW/SW: Tester Computer : Suns ULTRA60 / 256 MB RAM User ...
United States - Trusted Seller

MIRTEC MV-2HTL Desktop AOI Vision Inspection System – 2006 Offline PCB Inspection • Tested & Running • Complete Workstation
- Manufacturer: Mirtec
- Model: MV-2HTL
MIRTEC MV-2HTL Desktop AOI Vision Inspection System – 2006 PCB Inspection • Tested & Running • Complete Workstation --------------------------------------------------------------- DESCRIPTION Available for im...
Central Falls, RI - Trusted Seller

Nikon Optiphot 2 Microscope
- Manufacturer: Nikon
- Model: Optiphot 2
The microscope of the brand Nikon type Optiphot-2 is ideal for studying and viewing small objects that are not visible to the naked eye. Objectively
$3,574 USDApeldoorn, Netherlands - Trusted Seller

Veeco Dimension 3000
- Manufacturer: Veeco - Sloan
- Model: Dimension 3000
Veeco Raster Atomic Force Microscope Dimension 3000 (upgraded to 3001). Controller IIIa. STM mode. Computer. Monitors. Software 5.12r3. Oscilloscope. Vacuum pump. Vibration isolation table. Year of manufacture: 2...
Burladingen, Germany - Trusted Seller

Nordson Yestech YTV-FX
- Manufacturer: Nordson
For more information regarding stock and pricing, please click here. Nordson YESTECH YTV-FX in excellent condition. vintage 2011 Specifications: Defects Detected: Part: position, missing, wrong, polarity, skew, t...
Veenendaal, Netherlands 
Agilent 4156C Semiconductor Parameter Analyzer
- Manufacturer: Agilent - Keysight
- Model: 4156C
General features - Highly accurate laboratory bench top parameter analyzer for advanced device characterization - 4x High-resolution SMU, 2xVSU and 2xVMU - Fill-in-the blanks front panel operation - Measurement c...
- Trusted Seller

Keysight Technologies E5270B
- Manufacturer: Agilent - Keysight
- Model: E5270B
Precision Measurement Mainframe; Precision IV Analyzer / 8 Slot Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with th...
Harrow, United Kingdom - Trusted Seller

Keysight Technologies E5270B
- Manufacturer: Agilent - Keysight
- Model: E5270B
Precision Measurement Mainframe; Precision IV Analyzer / 8 Slot Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with th...
Los Angeles, CA - Trusted Seller

Takano WM-10R Surface Particle Inspection System
- Manufacturer: Takano
- Model: WM-10
TAKANO WM-10R SURFACE PARTICLE INSPECTION SYSTEM consisting of:- Model: WM-10R- Bare wafer surface defect inspection system- Substrate/Sizes: 2" - 12" Wafer Capable (Chuck and Carrier type dependent)- Substrate T...
Decatur, GA 
Rudolph FE-VII-SD
- Manufacturer: Rudolph
For sale is a high-precision Rudolph FE-VII-SD Ellipsometer, known for its advanced capabilities in thin film measurement and analysis. This tool is ideal for semiconductor manufacturing, materials research, and ...
$4,950 USDHayward, CA
