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24

Used sf

  • no-image_en.png

    KLA SFS-7700 313270

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 7700

    Defect insp Wafer size: 8"

    Yongin-si, South Korea
  • no-image_en.png

    1995 KLA Tencor SFS 7600

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 7600

    8", 2 cassette stage Wafer size: 200mm

    Yongin-si, South Korea
  • no-image_en.png

    1993 KLA Tencor SFS-6200

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6200

    Tencor Surfscan 6200 particle counter Part machine

    Yongin-si, South Korea
  • no-image_en.png

    1994 KLA Tencor SFS-6200

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6200

    Tencor Surfscan 6200 particle counter Wafer size: 8

    Yongin-si, South Korea
  • Trusted Seller
    Olympus MX61L-F 300MM (14x12 stage)

    Olympus MX61L-F 300MM (14x12 stage) Semiconductor & Flat Panel Display Inspection Microscope

    • used

    • Manufacturer: Olympus

    Olympus MX61L-F 300MM (14x12 stage) Semiconductor & Flat Panel Display Inspection Microscope SERIAL NUMBER: OJ61979 01) Titling Trinocular Observation Tube 02) Clutch Driven Manual XY Stage with coaxial contro...

    Asia
  • 1994 KLA TENCOR SFS 6200

    1994 KLA TENCOR SFS 6200

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6200

    *.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...

    Cheonan-si, South Korea
  • 1994 KLA TENCOR SFS 6200

    1994 KLA TENCOR SFS 6200

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6200

    *.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...

    Cheonan-si, South Korea
  • Kla Tencor SFS 7600

    Kla Tencor SFS 7600

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 7600

    Kla Tencor SFS 7600 Wafer: 150/200 mm SN: 0194-343 refurbish vintage: 1994

    Hong Kong
  • 2014 BESI X-Eye SF160 SL

    2014 BESI X-Eye SF160 SL

    • used

    • Manufacturer: BESI

    Function , needed motor vacuum to up this machine Power requirements: 380 V     3 Phase | Other information: Power Consumption : 6,25 kVA Temp Range : 20-28 C | Width: 82.283  in  (209.0 cm) | Height: 62.598  in ...

    $26,614 USD

    Get financing

    Est. $501/mo

    Regensburg, Germany
12

Overview

Semiconductor inspection and test equipment are specialized machines used to ensure the quality and functionality of semiconductor devices. These machines perform various tests and inspections, including visual inspection, electrical testing, and defect analysis, to identify and address any issues in the semiconductor manufacturing process. They are crucial in maintaining the high standards required in the semiconductor industry.

FAQ

What factors should I consider when buying semiconductor inspection and test equipment?

Consider the equipment's compatibility with your existing systems, the types of tests it performs, its accuracy, and the manufacturer's support and service options. Also, evaluate its overall condition and any included software or accessories.

How can I ensure safe shipping of semiconductor inspection and test equipment?

Use a specialized transport service experienced in handling delicate and high-value equipment. Ensure the equipment is properly packaged, secured, and insured during transit.

What maintenance is required for semiconductor inspection and test equipment?

Regular maintenance includes cleaning, calibration, and software updates. Follow the manufacturer’s guidelines for specific maintenance intervals and procedures to ensure optimal performance and longevity of the equipment.