Semiconductors » Test & Measurement (semiconductors)

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Used monitoring system

  • Trusted Seller
    1987 TENCOR Surfscan 4500 Particle

    1987 TENCOR Surfscan 4500 Particle Detection Tool

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 4500

    - Cassette to Cassette Handling of 3” - 6” Wafers - 0.2 micron Particle Size Sensitivity - New HeNe Laser & Power Supply - New 4” Calibrarion Wafer Included - Automatic Calibration - System Calibrated & Demonstra...

    United States
  • Trusted Seller
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    CHA 600

    • Manufacturer: CHA Industries

    18″ X 30″ HIGH S/S BELL JAR INFICON IC-6000 THICKNESS MONITOR. AUTOTECH II AUTOMATIC/MANUAL VALVING, ION/DUAL TC GAUGE. TEMESCAL CV-8 POWER SUPPLY SINGLE POCKET GUN (REBUILT), 2 STAGE DIRECT DRIVE ROUGHING PUMP (...

    Billerica, MA
  • Trusted Seller
    PLASMOS SD 4003 200mm Automated

    PLASMOS SD 4003 200mm Automated Ellipsometer AF-750 Lang MCC 12 + MP 4000 As-Is

    • Manufacturer: Plasmos

    - Part No: SD 4003 - Model No: SD 4000 - Configured for wafers up to 200mm - SD Version: 6.25A - Input: 230V, 50/60Hz - Sold As-Is Included Components - System Control Computer - Lang Controller Part No: MCC 12...

    United States
  • Trusted Seller
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    MONITORING SYSTEMS

    • Manufacturer: Unknown

    MONITORING SYSTEMS

    Bree, Ireland
  • Trusted Seller
    2006 KLA eS32 e-beam wafer

    2006 KLA eS32 e-beam wafer inspection 200mm

    • Manufacturer: KLA-Tencor

    KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This sy...

    United States
  • Trusted Seller
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    CHARGED PLATE MONITOR

    • Manufacturer: Ion Systems

    Trim, Ireland
  • Trusted Seller
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    MINIENVIROMENT MONITOR (LARGE)

    • Manufacturer: Particle Measuring Systems

    MINIENVIROMENT MONITOR (LARGE)

    Trim, Ireland
  • Trusted Seller
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    MINIENVIROMENT MONITOR (SMALL)

    • Manufacturer: Particle Measuring Systems

    MINIENVIROMENT MONITOR (SMALL)

    Trim, Ireland
  • ZERO ION TESTER

    ZERO ION TESTER

    • Manufacturer: Aqueous

    Ionic contamination testers were designed and implemented for the purpose of determining and monitoring the cleanliness of assemblies This system provides quick and precise cleanliness measurements of printed cir...

    Encinitas, CA
  • KLA-TENCOR SURFSCAN 6220 (SFS 6220)

    KLA-TENCOR SURFSCAN 6220 (SFS 6220)

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6220

    KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...

    $171,540 USD

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    Est. $3,228/mo

    San Jose, CA
  • Trusted Seller
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    Cascade PS21 Parametric Autoprober System 200mm w

    • Manufacturer: Cascade

    Cascade PS21 Parametric Autoprober System, 200mm, w ith Panasonic GP-KR222 camera, Panasonic camera controller, dual illumination sources, dual LCD monitors.

    Bree, Ireland
  • Trusted Seller
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    KLA Tencor F5X

    • Manufacturer: KLA-Tencor
    • Model: F5X

    The ASET-F5x thin film metrology system can measure materials across a continuous wavelength spectrum from 190 nm to 800 nm—a critical feature for meeting the stringent thin film measurement requirements down to ...

    Grapevine, TX
  • Trusted Seller
    KLA-TENCOR Surfscan Un-Patterned Wafer Surface

    KLA-TENCOR Surfscan Un-Patterned Wafer Surface Inspection

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 4500

    Fully Refurbished & Calibrated TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Suppl...

    Trim, Ireland
  • 2022 Nutek Reject inspection Conveyor

    2022 Nutek Reject inspection Conveyor (single zone)

    • Manufacturer: Nutek

    Description: The Reject Inspection Conveyor is a highly efficient solution designed for seamless good/bad PCB separation within SMT production lines. Its primary function is to enable operators to inspect and ve...

    Odense, Denmark
  • Trusted Seller
    Zeiss AXIOMAT NAC Microscope

    Zeiss AXIOMAT NAC Microscope

    • Manufacturer: Zeiss
    • Model: AXIOMAT NAC

    Zeiss AXIOMAT NAC Microscope Zeiss AXIOMAT NAC microscope operates in reflected light with bright field (BF), Nomarski DIC, and polarization modules. System includes: - Stage module A(R) with 5 dovetail slide...

    Trim, Ireland
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Overview

Semiconductor inspection and test equipment are specialized machines used to ensure the quality and functionality of semiconductor devices. These machines perform various tests and inspections, including visual inspection, electrical testing, and defect analysis, to identify and address any issues in the semiconductor manufacturing process. They are crucial in maintaining the high standards required in the semiconductor industry.

FAQ

What factors should I consider when buying semiconductor inspection and test equipment?

Consider the equipment's compatibility with your existing systems, the types of tests it performs, its accuracy, and the manufacturer's support and service options. Also, evaluate its overall condition and any included software or accessories.

How can I ensure safe shipping of semiconductor inspection and test equipment?

Use a specialized transport service experienced in handling delicate and high-value equipment. Ensure the equipment is properly packaged, secured, and insured during transit.

What maintenance is required for semiconductor inspection and test equipment?

Regular maintenance includes cleaning, calibration, and software updates. Follow the manufacturer’s guidelines for specific maintenance intervals and procedures to ensure optimal performance and longevity of the equipment.