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LTX 974-0248-00 Device Interface Board
1 in stock The LTX 974-0248-00 Device Interface Board is a specialized piece of equipment designed for use in semiconductor testing and assembly. Manufactured by LTX, this interface board allows for efficient com...
$1,200 USDNew York, USA - Trusted Seller

RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States - Trusted Seller

Agilent 4156C Semiconductor Parameter Analyzer
- Manufacturer: Agilent - Keysight
- Model: 4156C
General features Highly accurate laboratory bench top parameter analyzer for advanced device characterization 4x High-resolution SMU, 2xVSU and 2xVMU Fill-in-the blanks front panel operation Measurement capab...
United States 
Agilent/Keysight 4156C
- Manufacturer: Agilent - Keysight
- Model: 4156C
The Agilent 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and ad...
- Trusted Seller

Keysight Technologies E5270B
- Manufacturer: Agilent - Keysight
- Model: E5270B
Precision Measurement Mainframe; Precision IV Analyzer / 8 Slot Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with th...
Los Angeles, CA 
Rudolph FE-VII-SD
- Manufacturer: Rudolph
For sale is a high-precision Rudolph FE-VII-SD Ellipsometer, known for its advanced capabilities in thin film measurement and analysis. This tool is ideal for semiconductor manufacturing, materials research, and ...
$4,950 USDHayward, CA
KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CA
Agilent 4156C Semiconductor Parameter Analyzer
- Manufacturer: Agilent - Keysight
- Model: 4156C
General features - Highly accurate laboratory bench top parameter analyzer for advanced device characterization - 4x High-resolution SMU, 2xVSU and 2xVMU - Fill-in-the blanks front panel operation - Measurement c...
