Semiconductors » Metrology / Inspection (semiconductors)

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  • OCEANOPTICS P200-2-VIS-NIR

    OCEANOPTICS P200-2-VIS-NIR

    • Manufacturer: OCEANOPTICS

    Information: OCEANOPTICS P200-2-VIS-NIR System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT OPTIONS: We accept Paypal, Company Che...

    $377 USD
    Santa Barbara, CA
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    Varian UV-VIS-NIR

    • Manufacturer: Varian

    Varian UV-VIS-NIR UV-VIS-NIR

    Bree, Ireland
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    Rudolph NIR-3 200 mm

    • Manufacturer: Rudolph

    Rudolph NIR-3 200 mm Ellipsometer

    Bree, Ireland
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    Rudolph NIR-3 200 mm

    • Manufacturer: Rudolph

    Rudolph NIR-3 200 mm

    Bree, Ireland
  • PLATO Series

    PLATO Series

      Photoluminescence Mapping System The PLATO Series, Photoluminescence Mapping System, is a compound wafer defect inspection device utilizing the photoluminescence (PL) method. It can measure spectral characteristi...

      Kyoto, Japan
    • 2006 N&K NK5300

      2006 N&K NK5300

      • Manufacturer: N&K

      Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Cognex Pattern Recognition Software n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unload...

      Cheonan-si, South Korea
    • 2007 N&K N&K Little foot

      2007 N&K N&K Little foot 8000 CD

      • Manufacturer: N&K

      Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Reflectance, Polarized Cognex Pattern Recognition Software Windows 7 Operating System n&k's Thin Film Characterization S/W n&k's Sta...

      Cheonan-si, South Korea
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      N&K N&K 3000

      • Manufacturer: N&K

      n&k analyzer 3000 can simultaneously determine thickness and n&k spectra for all type of film/substrate combinations of pattrened and non-pattered wafers Non-destructive measurements of Trench Depth Thickness, Re...

      Cheonan-si, South Korea

    Overview

    Semiconductor metrology involves the measurement and analysis of semiconductor wafers and devices. This category includes tools and equipment used to ensure the precision and accuracy of semiconductor manufacturing processes. These instruments are vital for quality control, helping to detect defects and ensure that devices meet strict industry standards.

    FAQ

    What factors should I consider when buying semiconductor metrology equipment?

    Consider the equipment's measurement accuracy, resolution, and compatibility with your specific semiconductor processes. Evaluate the vendor's support services and the equipment's ease of integration into your existing systems.

    How can I ensure safe shipping of semiconductor metrology equipment?

    Use a specialized shipping service experienced in handling sensitive and high-precision equipment. Ensure the equipment is well-packaged with proper cushioning and handling instructions.

    What is the maintenance schedule for semiconductor metrology equipment?

    Regular calibration and inspection are essential. Follow the manufacturer's guidelines for preventative maintenance, including cleaning optical components and checking for software updates. Maintain a log of all maintenance activities.