Semiconductors » Metrology / Inspection (semiconductors)

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Used composition analysis

  • Trusted Seller
    HITACHI SU-70

    HITACHI SU-70

    • Manufacturer: Hitachi
    • Model: SU70

    Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Sc...

    United States
  • Trusted Seller
    Hitachi S 3000 N Scanning

    Hitachi S 3000 N Scanning Electron Microscope (SEM)

    • Manufacturer: Hitachi
    • Model: S-3000N

    - Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...

    United States
  • Hitachi SU-70

    Hitachi SU-70

    • Manufacturer: Hitachi
    • Model: SU70

    Up for sale is a high-performance Hitachi SU-70 Scanning Electron Microscope (SEM), renowned for its exceptional imaging capabilities and advanced features. This SEM is ideal for a wide range of applications, inc...

    $229,500 USD

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    Est. $4,319/mo

    Santa Clara, CA
  • HORIBA, Ltd. Xtrology

    HORIBA, Ltd. Xtrology

    • Manufacturer: Horiba

    Fully Automated Thin Film Inspection System Combines multiple sensors and automation technology to provide increased value for semiconductor wafer inspection The new product, "Xtrology," Fully Automated Thin Film...

    Kyoto, Japan
  • NCS ultrasonic C-scan flaw detection

    NCS ultrasonic C-scan flaw detection equipment

    • Manufacturer: NCS

    Instrument introduction suitable for laboratory research, but also can be used in aerospace, automotive, petrochemical, electric power and other industrial fields of disk ring parts, forging and casting parts, co...

    Beijing, China
  • Hitachi S-3400N Scanning Electron Microscope

    Hitachi S-3400N Scanning Electron Microscope

    • Manufacturer: Hitachi
    • Model: S-3400N

    Hitachi Model S-3400N Scanning Electron Microscope with TMP molecular pump vacuum system saves floor space and power supply power consumption. It is mainly used for the effective analysis of the microscopic morph...

    Shenzhen, China

Overview

Semiconductor metrology involves the measurement and analysis of semiconductor wafers and devices. This category includes tools and equipment used to ensure the precision and accuracy of semiconductor manufacturing processes. These instruments are vital for quality control, helping to detect defects and ensure that devices meet strict industry standards.

FAQ

What factors should I consider when buying semiconductor metrology equipment?

Consider the equipment's measurement accuracy, resolution, and compatibility with your specific semiconductor processes. Evaluate the vendor's support services and the equipment's ease of integration into your existing systems.

How can I ensure safe shipping of semiconductor metrology equipment?

Use a specialized shipping service experienced in handling sensitive and high-precision equipment. Ensure the equipment is well-packaged with proper cushioning and handling instructions.

What is the maintenance schedule for semiconductor metrology equipment?

Regular calibration and inspection are essential. Follow the manufacturer's guidelines for preventative maintenance, including cleaning optical components and checking for software updates. Maintain a log of all maintenance activities.