Building Filters
- Trusted Seller

Overlay Measurement System
- Manufacturer: Unknown
System to include the following: Archer AIM-03 Dual Fims Fully automated overlay measurement module including coherence probe interference microscope and automated wafer handling – measures BiB and AIM Grating ta...
Bree, Ireland - Trusted Seller

Darkfield Inspection
- Manufacturer: Unknown
Currently configured for 300mm wafer sizes Idle Date: 2/23/2013 Tool status: de installed & store in the clean room Cassette Interface: o Dual FIMS (300mm), Phoenix v1.3 o PHX Ship Kit included o Pre-Alig...
Bree, Ireland 
NCS NCS-PAUT automatic ultrasonic phased array flaw detection equipment for bars
- Manufacturer: Steel Nano
Instrument description suitable for metallurgy and steel, machinery, electric power, aerospace, oil and gas, boilers and other industries bar surface and internal defects detection. Instrument features 1. phased ...
Beijing, China
