Semiconductors » Metrology / Inspection (semiconductors) » Japan

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Used processing in Japan

  • MiPLATO-SiC

    MiPLATO-SiC

      SiC Wafer Defect Inspection System The SiC Wafer Defect Inspection System MiPLATO-SiC is a PL mapping system optimized for SiC wafers. It acquires the spectrum of the entire wafer in a short time using spiral map...

      Kyoto, Japan
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      OLYMPUS STM-7

      • Manufacturer: Olympus

      Manufacturing process: assembly

      Tokyo, Japan
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      NANOMETRICS VERTEX-SM-110

      • Manufacturer: Nanometrics
      • Model: VERTEX-SM-110

      Manufacturing process: examination

      Tokyo, Japan
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      HITACHI S-4700

      • Manufacturer: Hitachi
      • Model: S-4700

      Manufacturing process: examination

      Tokyo, Japan
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      JEOL 6380LV

      • Manufacturer: Jeol

      Manufacturing process: examination

      Tokyo, Japan
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      VEECO ULTRAMET100

      • Manufacturer: Veeco - Sloan

      Manufacturing process: examination

      Tokyo, Japan
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      HITACHI S-4800

      • Manufacturer: Hitachi
      • Model: S-4800

      Manufacturing process: examination

      Tokyo, Japan
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      2005 HITACHI S-9380II

      • Manufacturer: Hitachi
      • Model: S-9380 II

      Manufacturing process: examination | Inch: 12

      Tokyo, Japan
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      2008 HITACHI CG-4000

      • Manufacturer: Hitachi
      • Model: CG4000

      Manufacturing process: examination | Inch: 12

      Tokyo, Japan
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      2007 NANOMETRICS RPM Sigma

      • Manufacturer: Nanometrics

      Manufacturing process: examination | Inch: 6

      Tokyo, Japan
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      HITACHI S-8820

      • Manufacturer: Hitachi
      • Model: S-8820

      Manufacturing process: examination | Inch: 6

      Tokyo, Japan
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      KLA TENCOR P-2H

      • Manufacturer: KLA-Tencor
      • Model: P-2H

      Manufacturing process: examination | Inch: 6

      Tokyo, Japan
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      DNS RE-3100

      • Manufacturer: Dainippon Screen
      • Model: RE-3100

      Manufacturing process: examination | Inch: 8

      Tokyo, Japan
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      HITACHI S-4700

      • Manufacturer: Hitachi
      • Model: S-4700

      Manufacturing process: examination | Inch: 6

      Tokyo, Japan
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      HITACHI S-9260A

      • Manufacturer: Hitachi
      • Model: S-9260A

      Manufacturing process: examination | Inch: 8

      Tokyo, Japan
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    Overview

    Semiconductor metrology involves the measurement and analysis of semiconductor wafers and devices. This category includes tools and equipment used to ensure the precision and accuracy of semiconductor manufacturing processes. These instruments are vital for quality control, helping to detect defects and ensure that devices meet strict industry standards.

    FAQ

    What factors should I consider when buying semiconductor metrology equipment?

    Consider the equipment's measurement accuracy, resolution, and compatibility with your specific semiconductor processes. Evaluate the vendor's support services and the equipment's ease of integration into your existing systems.

    How can I ensure safe shipping of semiconductor metrology equipment?

    Use a specialized shipping service experienced in handling sensitive and high-precision equipment. Ensure the equipment is well-packaged with proper cushioning and handling instructions.

    What is the maintenance schedule for semiconductor metrology equipment?

    Regular calibration and inspection are essential. Follow the manufacturer's guidelines for preventative maintenance, including cleaning optical components and checking for software updates. Maintain a log of all maintenance activities.