Used Test & Measurement (Semiconductors)

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Nikon Optiphot 300
- Manufacturer: Nikon
- Model: Optiphot 300
Nikon Optiphot 300 with reflected and transmitted light and 10x14 XY stage travel Configured for Reflected and Transmitted Light Brightfield, Darkfield, observation Trinocular Viewing Head 5 place universal n...
United States
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RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States
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2012 Multitest MT 2168
- Manufacturer: Multitest
- Model: MT2168
Vintage 2012 Condition: like new Test Tool from multitest was rarely used for development project ABC - Excellent Condition (Basically new) - Complete (no missing parts) - No Damages - Fully testing COOLiR2...
United States
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Advantest T5771 ES
- Manufacturer: Advantest
- Model: T5771ES
Advantest T5771 ES Flash Memory Tester Flash Memory Tester A low-cost and high-throughput test system used in the front-end testing of flash memory that is capable of testing 128 devices simultaneously. The T5...
United States
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Zeiss LM100
- Manufacturer: Zeiss
- Model: LM100
Zeiss LM100 Microscope Large Panel Inspection Tool Zeiss large panel inspection and CD (critical dimension measurement) tool with laser autofocus Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x2...
United States
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2004 TEL P12XL
- Manufacturer: Tokyo Electron - TEL
- Model: P-12XL
TEL, P12XL Prober, 300mm, TEL P12XL Prober single foup VIP3A Tool Status Disconnected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober single foup VIP3A Software Version Rby00-R016.02U1 ...
United States
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2012 Advantest T6373 ND3
- Manufacturer: Advantest
- Model: T6373 ND3
Inspection Available Yes Description Working Condition ND3 Test Systems. (2) Available Condition Excellent PIN CONFIGURATION MAINFRAME : 1 ‐ 256 TH1 [CTD ] : 1 ‐ 256 LCD : 1 ‐ 2048 RVS : 1 ‐ 64 DPU CONFIG...
United States
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2019 TSK UF3000 EX prober
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000EX
De-Installed. It was in Working Condition. Wafer : 12 Inches. Vintage : 2019. It's complete with HDD and Software included. Configuration : - 12" Nickel Tri-Temp Chucktop - Tokyo Seimitsu Accretech ARTS-HS...
United States
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Nanometrics NanoSpec 8300X Film Thickness Analyzer Wafer
- Manufacturer: Nanometrics
- Model: Nanospec
NanoSpec 8300X Film Thickness Analyzer, Wafer Condition: For parts or not working Contents: Nanometrics 7000-0519, 7200-2161, 7200-2193 Nanometrics 7200-2266 Power Supply J.A. Woollam LPS-400 75W Xenon Ligh...
United States
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2009 Advantest M6541A
- Manufacturer: Advantest
- Model: M6541
Vintage: 2009 Handler
United States
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Advantest T2000 LS
- Manufacturer: Advantest
- Model: T2000LS
T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (1) BPS-034491 PMU32 Condition Good Working Condition/Off-Line Configuration T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (...
United States
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2011 KLA Candela 8620 Wafer Inspection System
- Manufacturer: KLA-Tencor
- Model: Candela 8620
- 1 Phase - 50/60 Hz 2011 Vintage
United States
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2019 Accretech UF3000EX Tri Temp
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000EX
Chiller included Inspection: Yes, Power Off Only Vintage : May-19 OS Ver : S6.39.BT Input : AC 210V Single pulse 12" Nickel Tri-temp Chucktop Standard Z Force Stage OpenFoub Single Wide Loader(125mm Space)...
United States
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1997 KLA-Tencor Surfscan 6220 Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
- Windows 98 SE - Software Version 4.2 - Previously refurbished in 2016 - Laser replaced in March of 2020 - Last PM performed August of 2023 1997 Vintage 2", 3", 4", 6", 8"
United States
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KLA-TENCOR Surfscan 6420
- Manufacturer: KLA-Tencor
- Model: Surfscan 6420
Surface Inspection System
United States
Agilent - Keysight 16058A Test & Measurement (semiconductors)
- Manufacturer: Agilent - Keysight
- Model: 16058A
Good condition Agilent - Keysight 16058A Test & Measurement (semiconductors)s available between 1990 and 1995 years. Located in USA and other countries. Click request price for more information.
USA