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RUDOLPH S3000A
- Manufacturer: Rudolph
- Model: S3000A
Wafer size: 12 | Shipping: EXW | Process: Focused Beam Laser Ellipsometry
South Korea
South Korea
RUDOLPH AXI-S
- Manufacturer: Rudolph
- Model: AXI
Macro Inspection System to detect wafer level and die level defects. Up to 8" 2 Load Port
Cheonan-si, South Korea
RUDOLPH AXI-930
- Manufacturer: Rudolph
- Model: AXI 930
Macro Inspection System to detect wafer level and die level defects. Up to 8" 2 Load Port Parts machine
Cheonan-si, South Korea
South Korea
South Korea
South Korea
South Korea
2005 RUDOLPH MP200
- Manufacturer: Rudolph
- Model: MP200
RUDOLPH METAPULSE (MP200)(S/N.1-00-MPO-1469-BF-08)
South Korea
2000 RUDOLPH MP200
- Manufacturer: Rudolph
- Model: MP200
RUDOLPH METAPULSE (MP200)(S/N.1-00-MPO-1096-AM-03)
South Korea
2011 RUDOLPH S3000A
- Manufacturer: Rudolph
- Model: S3000A
Wafer size: 12 | Shipping: EXW | Process: Focused Beam Laser Ellipsometry
South Korea
2010 RUDOLPH S3000A
- Manufacturer: Rudolph
- Model: S3000A
Wafer size: 12 | Shipping: EXW | Process: Focused Beam Laser Ellipsometry
South Korea
South Korea
South Korea
2007 RUDOLPH MP300
- Manufacturer: Rudolph
- Model: MP 300
Wafer size: 8" | Process: Film Thickness Measrement | Shipping: EXW
South Korea
Rudolph Metapulse Metrology / Inspection (semiconductors)
- Manufacturer: Rudolph
- Model: Metapulse
Good condition Rudolph Metapulse Metrology / Inspection (semiconductors)s available between 2003 and 2011 years. Located in Ireland and other countries. Click request price for more information.
Ireland