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Used Test & Measurement (Semiconductors)

  • Trusted Seller
    PLASMOS SD 4003 200mm Automated

    PLASMOS SD 4003 200mm Automated Ellipsometer AF-750 Lang MCC 12 + MP 4000 As-Is

    • Manufacturer: Plasmos

    - Part No: SD 4003 - Model No: SD 4000 - Configured for wafers up to 200mm - SD Version: 6.25A - Input: 230V, 50/60Hz - Sold As-Is Included Components - System Control Computer - Lang Controller Part No: MCC 12...

    United States
  • Trusted Seller
    RUDOLPH FE-VII-D, Focus Ellipsometer

    RUDOLPH FE-VII-D, Focus Ellipsometer

    • Manufacturer: Rudolph

    RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...

    United States
  • Trusted Seller
    2012 Multitest MT 2168

    2012 Multitest MT 2168

    • Manufacturer: Multitest
    • Model: MT2168

    Vintage 2012 Condition: like new Test Tool from multitest was rarely used for development project ABC - Excellent Condition (Basically new) - Complete (no missing parts) - No Damages - Fully testing COOLiR2...

    United States
  • Trusted Seller
    Advantest T5771 ES

    Advantest T5771 ES

    • Manufacturer: Advantest
    • Model: T5771ES

    Advantest T5771 ES Flash Memory Tester Flash Memory Tester A low-cost and high-throughput test system used in the front-end testing of flash memory that is capable of testing 128 devices simultaneously. The T5...

    United States
  • Trusted Seller
    Zeiss LM100

    Zeiss LM100

    • Manufacturer: Zeiss
    • Model: LM100

    Zeiss LM100 Microscope Large Panel Inspection Tool Zeiss large panel inspection and CD (critical dimension measurement) tool with laser autofocus Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x2...

    United States
  • Trusted Seller
    2004 TEL P12XL

    2004 TEL P12XL

    • Manufacturer: Tokyo Electron - TEL
    • Model: P-12XL

    TEL, P12XL Prober, 300mm, TEL P12XL Prober single foup VIP3A Tool Status Disconnected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober single foup VIP3A Software Version Rby00-R016.02U1 ...

    United States
  • Trusted Seller
    2003 TEL P12XL

    2003 TEL P12XL

    • Manufacturer: Tokyo Electron - TEL
    • Model: P-12XL

    TEL, P12XL, 300mm Tool Status Connected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober Software Version Standard CIM SECS GEM Process TEST Main System LA08 Prober 1 Factory Interfa...

    United States
  • Trusted Seller
    Advantest T2000 LS

    Advantest T2000 LS

    • Manufacturer: Advantest
    • Model: T2000LS

    T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (1) BPS-034491 PMU32 Condition Good Working Condition/Off-Line Configuration T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | ...

    United States
  • Trusted Seller
    2007 KLA Candela CS 20

    2007 KLA Candela CS 20 Wafer Inspection

    • Manufacturer: KLA-Tencor

    KLA Candela CS 20 Wafer Inspection - 1 Phase - 50/60 Hz - 115 V 2007 Vintage

    United States
  • Trusted Seller
    Veeco / Digital Instruments Dimension

    Veeco / Digital Instruments Dimension 3100 Atomic Force Microscope (AFM)

    • Manufacturer: Veeco - Sloan
    • Model: Dimension 3100

    - Comes with all necessary components Including: - Upgraded AFM Control Computer with NanoScope V 6.13 Control Software - NanoScope Analysis V 1.5 - Dual 22" Dell Flatscreen Monitors - Digital instruments Tr...

    United States
  • Trusted Seller
    2004 KLA- Tencor Surfscan SP

    2004 KLA- Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection

    • Manufacturer: KLA-Tencor
    • Model: Surfscan SP1

    - Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Already upgraded with ENH SS laser - Defect Map and Histogram with Zoom - RTDC (Real Time Defect Class...

    United States
  • Trusted Seller
    NIKON NWL860-TMB-SP

    NIKON NWL860-TMB-SP

    • Manufacturer: Nikon
    • Model: NWL860

    Nikon Eclipse L200 microscope with 5/10/20/50/100 LU Plan BD objectives for brightfield and darkfield Nikon NWL-860-TMB wafer loader with macro and backside inspection modes Nikon 8x8 shuttle stage Alignment p...

    United States
  • Trusted Seller
    KLA-Tencor SP 1 TBI Inspection

    KLA-Tencor SP 1 TBI Inspection System

    • Manufacturer: KLA-Tencor
    • Model: SP1

    - 3 Ports: 200 mm / 300 mm - Refurbished

    United States
  • Trusted Seller
    1992 KLA-Tencor Surfscan 6200 Surface

    1992 KLA-Tencor Surfscan 6200 Surface Defect Inspection System

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6200

    The KLA is complete and refurbished in 2015. No known condition issues.

    United States
  • Trusted Seller
    KLA AIT II system

    KLA AIT II system

    • Manufacturer: KLA-Tencor
    • Model: AIT II

    Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...

    United States
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    Tektronix 371B Test & Measurement (semiconductors)

    • Manufacturer: Tektronix
    • Model: 371B

    Good condition Tektronix 371B Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.

    USA
4647484950