N&K N&K 1700
used
- Manufacturer: N&K
*. Film Thickness and Trench profile measurement. *. Manual load Metrology system. *. Simultaneously determine thickness, n and k in the spectral range of 190-1000nm, trench profile and provide non-destructive, r...
Cheonan-si, South Korea
1996 NANOMETRICS 2100
used
- Manufacturer: Nanometrics
- silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon 500~ 40,000 A. - other thin films. *. Hardware configuration: - Optical microscope & objectives 5x,10x,40x. - Spectrophotometer Head. - Microc...
Cheonan-si, South Korea
1995 KLA TENCOR P-10
used
- Manufacturer: KLA-Tencor
- Model: P-10
- Standard Head with L(yellow) type stylus. - Intel Pentium 233Mhz Ram:32MB , HDD: 2GB - Installed in Clean-room.
Cheonan-si, South Korea
KLA TENCOR P-2
used
- Manufacturer: KLA-Tencor
- Model: P-2
- Long Scan Profiler Measurement. - Standard Head with L type stylus. - 486DX PC & LCD Color Monitor, MS-DOS 6.22. - Anti-bivration table. - Installed in Clean-room. - Fully refurbished. - Can demonstrate any time.
Cheonan-si, South Korea
2001 NIKON NWL641M
used
- Manufacturer: Nikon
- Model: NWL641
IC Inspection Wafer Loader Orientation flat/notch detection
Cheonan-si, South Korea
1997 LEO/KOBELCO LTA-700
used
- Manufacturer: Kobelco
Variiable Injection Type Wafer Lifetime Measuring System.
Cheonan-si, South Korea
HITACHI S-5500
used
- Manufacturer: Hitachi
- Model: S-5500
In-lens Field Emission Scanning Electron Microscope. Imgae Resolution : - 0.4nm guaranteed at accelerating voltage 30kV - 1.6nm guaranteed at accelerating voltage 1kV Magnification : - LM Mode 60X~100,0000X - H...
Cheonan-si, South Korea
2000 KLA TENCOR VIPER 2410
used
- Manufacturer: KLA-Tencor
- Model: Viper 2410
KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- cri...
Cheonan-si, South Korea
1998 KLA TENCOR HRP100
used
- Manufacturer: KLA-Tencor
*. To be refurbished *. Installed in Clean-room. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2006 KLA TENCOR CS20
used
- Manufacturer: KLA-Tencor
- Model: CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
2001 SOLID STATE MEASRUEMENT INC. SSM495
used
- Manufacturer: SOLID STATE MEASRUEMENT INC.
■ Capable up to 8" Wafer ■ SSM 42 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ CDA: 80...
Cheonan-si, South Korea
2004 SOLID STATE MEASRUEMENT INC. SSM5130
used
- Manufacturer: SOLID STATE MEASRUEMENT INC.
■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Auto wafer handling (Genmark robot & pre aligner) ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Driv...
Cheonan-si, South Korea
1997 KLA TENCOR P-11
used
- Manufacturer: KLA-Tencor
- Model: P-11
- Long Scan Profiler P-11 Measurement. - Micro Head sr with Orange stylus. - Pentium 233MHz, Ram 31MB & 17" LCD Color Monitor, Windows 3.1. - Installed in Clean-room.
Cheonan-si, South Korea
FISCHIONE Model 1010
used
- Manufacturer: FISCHIONE
Tabletop precision ion milling and polishing system -Two independently adjustable Hollow Anode Discharge (HAD) ion sources. -High or low energy operation for either rapid milling or more gentle specimen polishing...
Cheonan-si, South Korea
MICROMANUPULATOR 6400F
used
- Manufacturer: MICROMANUPULATOR
- Micro manupulator Manual Probe Station 6400F - Joystick Controlled Motorized Stage - 200mm Vacuum chuck with 6"x6" XY travel, theta - 10X Eye pieces B&L - MM 550 3 axis probe with ultrasonic transducer & power ...
Cheonan-si, South Korea
Tip: Enter manufacturer, model or keyword