1995 KLA TENCOR P-10
used
- Manufacturer: KLA-Tencor
- Model: P-10
- Standard Head with L(yellow) type stylus. - Intel Pentium 233Mhz Ram:32MB , HDD: 2GB - Installed in Clean-room.
Cheonan-si, South Korea
KLA TENCOR P-2
used
- Manufacturer: KLA-Tencor
- Model: P-2
- Long Scan Profiler Measurement. - Standard Head with L type stylus. - 486DX PC & LCD Color Monitor, MS-DOS 6.22. - Anti-bivration table. - Installed in Clean-room. - Fully refurbished. - Can demonstrate any time.
Cheonan-si, South Korea
2001 NIKON NWL641M
used
- Manufacturer: Nikon
- Model: NWL641
IC Inspection Wafer Loader Orientation flat/notch detection
Cheonan-si, South Korea
1997 LEO/KOBELCO LTA-700
used
- Manufacturer: Kobelco
Variiable Injection Type Wafer Lifetime Measuring System.
Cheonan-si, South Korea
HITACHI S-5500
used
- Manufacturer: Hitachi
- Model: S-5500
In-lens Field Emission Scanning Electron Microscope. Imgae Resolution : - 0.4nm guaranteed at accelerating voltage 30kV - 1.6nm guaranteed at accelerating voltage 1kV Magnification : - LM Mode 60X~100,0000X - H...
Cheonan-si, South Korea
2000 KLA TENCOR VIPER 2410
used
- Manufacturer: KLA-Tencor
- Model: Viper 2410
KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- cri...
Cheonan-si, South Korea
1998 KLA TENCOR HRP100
used
- Manufacturer: KLA-Tencor
*. To be refurbished *. Installed in Clean-room. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2006 N&K NK5300
used
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Cognex Pattern Recognition Software n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unload...
Cheonan-si, South Korea
2007 N&K N&K Little foot 8000 CD
used
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Reflectance, Polarized Cognex Pattern Recognition Software Windows 7 Operating System n&k's Thin Film Characterization S/W n&k's Sta...
Cheonan-si, South Korea
1993 KLA TENCOR FLX2320
used
- Manufacturer: KLA-Tencor
- Model: FLX-2320
*.Measurement *.Utility *.Intalled in a clean room and can demonstrate any time.
Cheonan-si, South Korea
2009 KLA TENCOR CS10V
used
- Manufacturer: KLA-Tencor
- Model: CS10V
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
2006 KLA TENCOR CS20
used
- Manufacturer: KLA-Tencor
- Model: CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
2005 N&K 1700RT
used
- Manufacturer: N&K
Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. The n&k 1700-RT is designed for handling 5” or 6” square masks. The n&k 1700-RT simultaneously determines thickness...
Cheonan-si, South Korea
2008 SOLID STATE MEASRUEMENT INC. SSM530
used
- Manufacturer: SOLID STATE MEASRUEMENT INC.
■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ CDA: 8...
Cheonan-si, South Korea
NANOMETRICS 210
used
- Manufacturer: Nanometrics
- Model: 210
- silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon 500~ 40,000 A. - other thin films. *. Hardware configuration: - Optical microscope & objectives 5x,10x,40x. - Spectrophotometer Head. - Microc...
Cheonan-si, South Korea
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