1996 VEECO Dimension 7000
used
- Manufacturer: Veeco - Sloan
- Model: Dimension 7000
As-Is, 8" Automatic AFM tool Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2017 KLA TENCOR P-17
used
- Manufacturer: KLA-Tencor
[Features] - Microhead 5-xr (13, 131, 1048 um range) - Objective lens : 6.4x, Magnification range : 173x~750x - Scan full diameter of the sample without stitching for bow and film stress measurement - Fully motor...
Cheonan-si, South Korea
Microsense Microsense 6033T
used
- Manufacturer: Microsense
Wafer Thickness gauge for up to 150mm wafers Wafer size: 6" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
SOLID STATE MEASRUEMENT INC. SSM2000
used
- Manufacturer: SOLID STATE MEASRUEMENT INC.
System Measurement Performance Computer Subsystem Automated Features •;; Probe conditioning /•;; Probe calibration /•;; Sample alignment /•;; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing S...
Cheonan-si, South Korea
2006 N&K N&K 5000-CD
used
- Manufacturer: N&K
To be fully refurbished. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2012 KLA TENCOR P16+
used
- Manufacturer: KLA-Tencor
- Model: P16
The KLA-Tencor P-16+ Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. •; Up to 8" wafer size •; Microhead 5 - sr •; Dual view optic (Top & sid...
Cheonan-si, South Korea
2004 SOLID STATE MEASRUEMENT INC. SSM 2000 Nano SRP
used
- Manufacturer: SOLID STATE MEASRUEMENT INC.
System Measurement Performance Computer Subsystem Automated Features •; Probe conditioning /•; Probe calibration /•; Sample alignment /•; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing Subsy...
Cheonan-si, South Korea
2010 SDI/SEMILAB MCV2500
used
- Manufacturer: Semilab
■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ CDA: 8...
Cheonan-si, South Korea
SDI/SEMILAB FAaST 200 SL
used
- Manufacturer: Semilab
- Model: FAAST 200 SL
non-contact electrical C-V & I-V measurement system capable of measuring on product wafers. Measurements can be made in scribe line test sites or in the active cell area. Cell measurements allow for the first ti...
Cheonan-si, South Korea
2005 KLA TENCOR OSA6100
used
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
2006 KLA TENCOR OSA6100
used
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
N&K N&K 1700
used
- Manufacturer: N&K
*. Film Thickness and Trench profile measurement. *. Manual load Metrology system. *. Simultaneously determine thickness, n and k in the spectral range of 190-1000nm, trench profile and provide non-destructive, r...
Cheonan-si, South Korea
1996 NANOMETRICS 2100
used
- Manufacturer: Nanometrics
- silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon 500~ 40,000 A. - other thin films. *. Hardware configuration: - Optical microscope & objectives 5x,10x,40x. - Spectrophotometer Head. - Microc...
Cheonan-si, South Korea
1995 KLA TENCOR P-10
used
- Manufacturer: KLA-Tencor
- Model: P-10
- Standard Head with L(yellow) type stylus. - Intel Pentium 233Mhz Ram:32MB , HDD: 2GB - Installed in Clean-room.
Cheonan-si, South Korea
KLA TENCOR P-2
used
- Manufacturer: KLA-Tencor
- Model: P-2
- Long Scan Profiler Measurement. - Standard Head with L type stylus. - 486DX PC & LCD Color Monitor, MS-DOS 6.22. - Anti-bivration table. - Installed in Clean-room. - Fully refurbished. - Can demonstrate any time.
Cheonan-si, South Korea
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