Used Test & Measurement (Semiconductors) in Wexford, Ireland

Trusted Seller
Toray 7000R300 12 2010 Automatic Wafer Inspection
- used
- Manufacturer: Toray
Toray 7000R300 12″ 2010 Automatic Wafer Inspection
Bree, Ireland
Trusted Seller
HITACHI IS3000E 12 2007 E beam inspection
- used
- Manufacturer: Hitachi
HITACHI IS3000E 12″ 2007 E beam inspection
Bree, Ireland
Trusted Seller
LEICA INS-3000 DUV 8 2006 Wafer Defect Inspection
- used
- Manufacturer: Leica
LEICA INS-3000 DUV 8″ 2006 Wafer Defect Inspection
Bree, Ireland
Trusted Seller
Olympus Olympus AL3130F 12
- used
- Manufacturer: Olympus
Olympus Olympus AL3130F 12″
Bree, Ireland
Trusted Seller
LEICA LEICA AG AUTO SCOPE
- used
- Manufacturer: Leica
LEICA LEICA AG AUTO SCOPE
Bree, Ireland
Trusted Seller
Catalyst Teradyne Tester
- used
- Manufacturer: Teradyne
- Model: Catalyst
Catalyst Teradyne Tester
Bree, Ireland
Trusted Seller
Nidec im800 Wafer inspection
- used
- Manufacturer: Unknown
Nidec im800 Wafer inspection
Bree, Ireland
Trusted Seller
INSPECTION SCOPE INSPECTION SCOPE NA
- used
- Manufacturer: Unknown
N/A INSPECTION SCOPE INSPECTION SCOPE N/A
Bree, Ireland
Trusted Seller
DMS I-GEMINUS 6000 12
- used
- Manufacturer: DMS
DMS I-GEMINUS 6000 12″
Bree, Ireland
Trusted Seller
SIGMA INTEST M173
- used
- Manufacturer: Sigma
SIGMA INTEST M173 AIR CAL
Bree, Ireland
Trusted Seller
NEXTEST MAV1 PT
- used
- Manufacturer: Unknown
NEXTEST MAV1 PT TESTER
Bree, Ireland
Trusted Seller
NEXTEST MAV1 PT
- used
- Manufacturer: Unknown
NEXTEST MAV1 PT TESTER
Bree, Ireland
Trusted Seller
MEGA Q262
- used
- Manufacturer: Mega
MEGA Q2/62 TESTER
Bree, Ireland
Trusted Seller
CREDENZA STS5020
- used
- Manufacturer: Unknown
CREDENCE STS5020 TESTER
Bree, Ireland
Trusted Seller
NEXTEST MAV1 PT
- used
- Manufacturer: Unknown
NEXTEST MAV1 PT TESTER
Bree, Ireland

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Lumentum - Surplus Semiconductor Fabrication Tools and Optical Communication Testers from Takao Japan Facility

Used Test & Measurement (Semiconductors) in Wexford, Ireland

Toray 7000R300 12 2010 Automatic Wafer Inspection

HITACHI IS3000E 12 2007 E beam inspection

LEICA INS-3000 DUV 8 2006 Wafer Defect Inspection

Olympus Olympus AL3130F 12

LEICA LEICA AG AUTO SCOPE

Catalyst Teradyne Tester

Nidec im800 Wafer inspection

INSPECTION SCOPE INSPECTION SCOPE NA

DMS I-GEMINUS 6000 12

SIGMA INTEST M173

NEXTEST MAV1 PT

NEXTEST MAV1 PT

MEGA Q262

CREDENZA STS5020

NEXTEST MAV1 PT

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Semiconductors » Test & Measurement (semiconductors) » Wexford

Search By Manufacturer

Building Filters

Lumentum - Surplus Semiconductor Fabrication Tools and Optical Communication Testers from Takao Japan Facility

Used Test & Measurement (Semiconductors) in Wexford, Ireland