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Used Test & Measurement (Semiconductors) in Georgia, USA

  • Trusted Seller
    Rudolph / August NSX-95 Automated

    Rudolph / August NSX-95 Automated Defect Inspection

    • Manufacturer: Rudolph
    • Model: NSX-95

    Rudolph / August NSX-95 Automated Defect Inspection consisting of: - Model: NSX-95- NSX Automated Wafer Handling System- WHS (Wafer Handler System) top plate- 4”/6”/8” Wafer Handler- Xandex 350-0002 Pneumatic Die...

    Decatur, GA
  • Trusted Seller
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    Takano WM-10R Surface Particle Inspection System

    • Manufacturer: Takano
    • Model: WM-10

    TAKANO WM-10R SURFACE PARTICLE INSPECTION SYSTEM consisting of:- Model: WM-10R- Bare wafer surface defect inspection system- Substrate/Sizes: 2" - 12" Wafer Capable (Chuck and Carrier type dependent)- Substrate T...

    Decatur, GA
  • Trusted Seller
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    KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System

    • Manufacturer: KLA-Tencor
    • Model: Surfscan SP1

    KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTIONSYSTEM consisting of:- Model: SP1 DLS with 300mm Single FOUP/FIMS Handler (other handlers available)- Currently Configured for 200/300mm Wafers - Unpatter...

    Decatur, GA
  • Trusted Seller
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    Takano Vi-4207 R/C Patterned Wafer Visual Inspection System

    • Manufacturer: Takano

    Takano Vi-4207 R/C Patterned Wafer Visual Inspection System consisting of:- Model: Vi-4207 R/C - Pattern Inspection System- Substrate/Sizes: 2" - 8" Wafer Capable - Open Cassette Handler- Optical System: Coaxial,...

    Decatur, GA
  • Trusted Seller
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    CDE ResMap 273 Resistivity Mapping System

    • Manufacturer: CDE
    • Model: Resmap

    CDE ResMap 273 Resistivity Mapping System consisting of:- Manufacturer: Creative Design Engineering - Model: ResMap 273 - PC w/ windows XP- Maximum Throughput: 1 minute per wafer- Measurement Range: 2 mΩ/- 5 MΩ/...

    Decatur, GA
  • Trusted Seller
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    KLA-Tencor Surfscan 6420 Particle Inspection System

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6420

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    Decatur, GA
  • Trusted Seller
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    KLA Tencor Altair 8920 Wafer Inspection System

    • Manufacturer: KLA-Tencor

    KLA Tencor Altair 8920 Wafer Inspection System consisting of: - Configured for 200/300mm - Manuals and Documentation - Please inquire for more information!

    Decatur, GA
  • Trusted Seller
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    Takano Vi-4307 M/C Patterned Wafer Visual Inspection System

    • Manufacturer: Takano

    Takano Vi-4307 M/C Patterned Wafer Visual Inspection System consisting of:- Model: Vi-4307 M/C- Pattern Inspection System- Substrate/Sizes: 4" - 12" Wafer Capable - Handler Options: Open Cassette, FOUP, FOSB- Opt...

    Decatur, GA
  • Trusted Seller
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    Takano Vi-5301 M Patterned Wafer Visual Inspection System

    • Manufacturer: Takano

    Takano Vi-5301 M Patterned Wafer Visual Inspection System consisting of:- Model: Vi-5301 M- Pattern Inspection System- Substrate/Sizes: 4" - 12" Wafer Capable - Handler Options: Open Cassette, FOUP, FOSB- Optical...

    Decatur, GA
  • Trusted Seller
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    KLA Tencor Altair 8935 Wafer Inspection System

    • Manufacturer: KLA-Tencor

    KLA Tencor Altair 8935 Wafer Inspection System consisting of: - Multiple Wafer Size Configurations Available - Manuals and Documentation - Please inquire for more information!

    Decatur, GA
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    Rudolph NSX-95 Test & Measurement (semiconductors)

    • Manufacturer: Rudolph
    • Model: NSX-95

    Good condition Rudolph NSX-95 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.

    USA
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    Takano WM-7 Test & Measurement (semiconductors)

    • Manufacturer: Takano
    • Model: WM-7

    Good condition Takano WM-7 Test & Measurement (semiconductors)s manufactured in 2000. Located in USA and other countries. Click request price for more information.

    USA
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    KLA-Tencor AIT I Test & Measurement (semiconductors)

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    Good condition KLA-Tencor AIT I Test & Measurement (semiconductors)s manufactured in 1997. Located in Ireland and other countries. Click request price for more information.

    Ireland
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    Rudolph NSX-105 Test & Measurement (semiconductors)

    • Manufacturer: Rudolph
    • Model: NSX-105

    Good condition Rudolph NSX-105 Test & Measurement (semiconductors)s available between 2003 and 2004 years. Located in Ireland and other countries. Click request price for more information.

    Ireland
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    Rudolph NSX-115 Test & Measurement (semiconductors)

    • Manufacturer: Rudolph
    • Model: NSX-115

    Good condition Rudolph NSX-115 Test & Measurement (semiconductors)s manufactured in 2010. Located in USA and other countries. Click request price for more information.

    Asia
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    Takano WM-10 Test & Measurement (semiconductors)

    • Manufacturer: Takano
    • Model: WM-10

    Good condition Takano WM-10 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.

    USA
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