Used Metrology / Inspection (Semiconductors) in Wexford, Ireland

BIORAD Q6 Overlay Metrology Tool

• used

• Manufacturer: Bio-Rad

Overlay Metrology Tool

BIORAD Q7 Overlay Metrology Tool

• used

• Manufacturer: Bio-Rad

Overlay Metrology Tool

BIORAD Q5 Overlay Metrology Tool

• used

• Manufacturer: Bio-Rad
• Model: Q5

Overlay Metrology Tool, 2ea Available

BIORAD Q7Q8 Overlay Metrology Tool

• used

• Manufacturer: Bio-Rad
• Model: Q8

Overlay Metrology / CD Measurement Tool for up to 200mm Wafers, 2ea Available

HP 4145B SEMICONDUCTOR PARAMETERS

• used

• Manufacturer: HP

HP 4145B SEMICONDUCTOR PARAMETER

BIORAD Q8 Overlay Metrology Tool

• used

• Manufacturer: Bio-Rad
• Model: Q8

Overlay Metroloty / CD Measurement Tool for up to 200mm Wafers

Metrology NT3100

• used

• Manufacturer: Unknown

Metrology NT3100 Bright-Field Inspection 300 mm Vintage 2006

Dage Metrology

• used

• Manufacturer: Nordson DAGE

Dage Metrology Metrology

Metrology NT3100

• used

• Manufacturer: Unknown

Metrology NT3100 Bright-Field Inspection 300 mm Vintage 2006

Aerotech Metrology

• used

• Manufacturer: Arix

Aerotech Metrology Metrology

Applied Materials NanoSEM 3D semiconductor equipment semiconductor equipment used

• used

• Manufacturer: Amat
• Model: NanoSEM

Semiconductor Diagnostics Inc FAaST-300SL

• used

• Manufacturer: Unknown

Semiconductor Diagnostics, Inc. FAaST-300SL Wafer Characterization

Frontier Semiconductor Four Point Probe

• used

• Manufacturer: Unknown

Frontier Semiconductor Four Point Probe Four Point Probe

KLA-Tencor Metrology

• used

• Manufacturer: KLA-Tencor

KLA-Tencor Metrology Metrology

Semilab IR3100s

• used

• Manufacturer: Semilab

Semilab IR3100s Semilab, AMS, IR3100S, Small spot, IR-Near IR, Metrology, 300mm Semilab, AMS, IR3100S, Small spot, IR-Near IR, Metrology, 300mm Complete IR3100 small spot Model-Based IR to Near-IR semiconductor m...