HORIBA, Ltd. Xtrology
new
- Manufacturer: Horiba
Fully Automated Thin Film Inspection System Combines multiple sensors and automation technology to provide increased value for semiconductor wafer inspection The new product, "Xtrology," Fully Automated Thin Film...
Kyoto, Japan
HORIBA, Ltd. PD10
new
- Manufacturer: Horiba
Reticle / Mask Particle Detection System Next-generation inspection platform to meet future needs PD10 is the latest generation of the HORIBA Particle Inspection product line. Based on an innovative modular platf...
Kyoto, Japan
HORIBA, Ltd. PD10-EX
new
- Manufacturer: Horiba
Reticle / Mask Particle Detection System Complete particle detection and removal with one machine for enhanced efficiency and yield improvement in semiconductor manufacturing processes Since its launch in 1984, t...
Kyoto, Japan
HORIBA, Ltd. RP-1
new
- Manufacturer: Horiba
Reticle/Mask Particle Remover The RP-1 automatically removes particles from the reticle/mask by air (or N2) and vacuum suction. Routinely removing the particles before the lithography process extends the replacem...
Kyoto, Japan
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