BIO-RAD QS-300
used
- Manufacturer: Bio-Rad
- Model: QS-300
BIO-RAD FT-IR QS-300 Spectrometer .FTS40 Spectrometer - He-Ne Laser - IR Source - DTGS Detector - KBr Beam Splitter .Up to 8 Inch, Wafer Tray/Nose Cone .FTS Power Supply .Windows XP PC & LCD Monitor .EPI,BPSG, C....
Cheonan-si, South Korea
2017 KLA TENCOR P-17
used
- Manufacturer: KLA-Tencor
[Features] - Microhead 5-xr (13, 131, 1048 um range) - Objective lens : 6.4x, Magnification range : 173x~750x - Scan full diameter of the sample without stitching for bow and film stress measurement - Fully motor...
Cheonan-si, South Korea
2010 SDI/SEMILAB MCV2500
used
- Manufacturer: Semilab
■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ CDA: 8...
Cheonan-si, South Korea
SDI/SEMILAB FAaST 200 SL
used
- Manufacturer: Semilab
- Model: FAAST 200 SL
non-contact electrical C-V & I-V measurement system capable of measuring on product wafers. Measurements can be made in scribe line test sites or in the active cell area. Cell measurements allow for the first ti...
Cheonan-si, South Korea
2005 KLA TENCOR OSA6100
used
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
2006 KLA TENCOR OSA6100
used
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
2006 KLA TENCOR CS20
used
- Manufacturer: KLA-Tencor
- Model: CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
2009 KLA TENCOR CS10V
used
- Manufacturer: KLA-Tencor
- Model: CS10V
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
2006 KLA TENCOR CS20
used
- Manufacturer: KLA-Tencor
- Model: CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
2005 N&K 1700RT
used
- Manufacturer: N&K
Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. The n&k 1700-RT is designed for handling 5” or 6” square masks. The n&k 1700-RT simultaneously determines thickness...
Cheonan-si, South Korea
2006 N&K N&K 5700 CDRT
used
- Manufacturer: N&K
Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. The n&k 5700-CDRT automated system is designed for handling 5” or 6” square masks. The n&k 5700-CDRT simultaneously...
Cheonan-si, South Korea
1997 LEO/KOBELCO LTA-700
used
- Manufacturer: Kobelco
Variiable Injection Type Wafer Lifetime Measuring System.
Cheonan-si, South Korea
HITACHI S-5500
used
- Manufacturer: Hitachi
- Model: S-5500
In-lens Field Emission Scanning Electron Microscope. Imgae Resolution : - 0.4nm guaranteed at accelerating voltage 30kV - 1.6nm guaranteed at accelerating voltage 1kV Magnification : - LM Mode 60X~100,0000X - H...
Cheonan-si, South Korea
2006 N&K NK5300
used
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Cognex Pattern Recognition Software n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unload...
Cheonan-si, South Korea
2007 N&K N&K Little foot 8000 CD
used
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Reflectance, Polarized Cognex Pattern Recognition Software Windows 7 Operating System n&k's Thin Film Characterization S/W n&k's Sta...
Cheonan-si, South Korea
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