Used electronics

EDXIR-Analysis Contaminant Finder/Material Inspector

EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (...

EDX-7200

The EDX-7200 is a flagship model of the EDX series in pursuit of high sensitivity, high speed and high precision. This model supports new regulations and directives for consumer and environmental compliance, such...

EDX-8100

One EDX over all others The EDX-8100 offers a high level of accuracy and speed in analyzing elements contained in various samples. Features Supports Various Applications in Many Fields ■ Electrical/electronic mat...

ATP LCD Touch Screen Rapid Fluorescence Detector Surface Colony Count Tester

• Manufacturer: Baxit

The device is a brand new upgraded product with a large touch screen instead of traditional buttons. The operation uses a biochemical reaction method to detect ATP content. The ATP fluorescence detector is based ...

HORIBA Scientific FLIMera

• Manufacturer: Horiba

SPAD array imaging camera for dynamic FLIM studies at real time video rates A New Concept in FLIM Imaging The HORIBA FLIMera camera is a new concept in FLIM technology. It is a wide field imaging camera, rather t...

HTA HT1000I - HT1100I

• Manufacturer: HTA

HT1000I - HT1100I: Automatic Sample Changer Compatible with a wide range of spectroscopy applications. It has been engineered to offer a better user experience by straight forward operations, the latest generatio...

Aas Automatic Atomic Absorption Spectrophotometer Aas Analyzer Flame

• Manufacturer: Gold

Automatic Atomic Absorption Spectrophotometer Aas Analyzer Flame Product Parameters 0 Item GD-4530F Automatic AAS Analyzer Flame Atomic Absorption Spectrophotometer 1 Wavelength range ...

Atomic Absorption Spectrophotometer Aas Analyzer

• Manufacturer: Gold

Characteristics: 1. Build in computer data processing and LCD: adopting highly integrated micro digital circuit, which is stable and reliable with the functions of integral holding, peak height and area, auto zer...

CCD, sCMOS & EMCCD Cameras for X-ray and EUV

• Manufacturer: ANDOR / Oxford Instruments

Andor’s portfolio of CCD, sCMOS and EMCCD cameras provide a wide range of high sensitivity, high dynamic range and fast detection solutions for table-top laboratory and beamline experiments. These detectors benef...

HORIBA France SAS Cathodoluminescence - CLUE Series

• Manufacturer: Horiba

Cathodoluminescence Solutions for Electron Microscopy HORIBA's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is ...

HORIBA Scientific DeltaFlex

• Manufacturer: Horiba

TCSPC/MCS Fluorescence Lifetime System Ultimate TCSPC/MCS Performance and Flexibility for Lifetimes From 5 Picoseconds to Seconds The HORIBA DeltaFlex™ system is the Time-Correlated Single Photon Counting (TCSPC)...

HORIBA France SAS UVISEL Plus

• Manufacturer: Horiba

Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm The Reference Ellipsometer for Thin Film Measurements The UVISEL Plus ellipsometer offers the best combination of modularity and performance for advanced...

HORIBA Scientific PPD Photon Counting Detector

• Manufacturer: Horiba

Single photons detection with picosecond accuracy Picosecond photon detection made easy. The PPD Series is a range of miniaturized single-photon counting detectors containing all the electronics necessary to dete...

HORIBA Scientific DeltaPro

• Manufacturer: Horiba

TCSPC Lifetime Fluorometer Compact, affordable and modular fluorescence lifetime spectrometer – time correlated single photon counting for any lab The DeltaPro has taken the complexity of time correlated single p...

HORIBA France SAS nanoGPS navYX

• Manufacturer: Horiba

Collaborative Correlative Microscopy Correlative microscopy is the combination of multiple modalities performed on the same sample. The results produced emphasize the strengths of each modality while offsetting t...