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2000 HITACHI S-4160
- Manufacturer: Hitachi
- Model: S-4160
Performance: Electron Optics: Sample Chamber X/Y: 150 mm, Z: 5-30 mm, T: 0 Deg - +45 Deg., R: 360 deg continuous Display system: Vacuum system: Full automatic operation with pneumatic valve control
Cheonan-si, South Korea
1998 PROMETRIX RS35
- Manufacturer: PROMETRIX
*. Measurement perfomance: - 4 Point Probe check surface on Silicon wafer - Measurement range 5 Megohm/sq - Routine check 1-30 sites programmable - Counter/ 3-D map, Diameter scan 49,81,121,225,361,441,625 site...
Cheonan-si, South Korea
HITACHI S-5500
- Manufacturer: Hitachi
- Model: S-5500
In-lens Field Emission Scanning Electron Microscope. Imgae Resolution : - 0.4nm guaranteed at accelerating voltage 30kV - 1.6nm guaranteed at accelerating voltage 1kV Magnification : - LM Mode 60X~100,0000X - H...
Cheonan-si, South Korea
1998 SOLID STATE MEASRUEMENT INC. SSM150
- Manufacturer: SOLID STATE MEASRUEMENT INC.
*. Measurement perfomance: - Resistivity and Dopant concentration - Resistance measurement & Carrier concentration profile analysis in all structures of silicon *. Measurement configuration: - Carrier concentrati...
Cheonan-si, South Korea
1992 PROMETRIX RS 35
- Manufacturer: PROMETRIX
*. Measurement perfomance: - 4 Point Probe check surface on Silicon wafer - Measurement range 5 Megohm/sq - Routine check 1-30 sites programmable - Counter/ 3-D map, Diameter scan 49,81,121,225,361,441,625 site...
Cheonan-si, South Korea
1996 HITACHI S-5000
- Manufacturer: Hitachi
- Model: S-5000
*. Image Resolution: - 30KV 0.6nm - 1 KV 2.5nm with a test specimen *.Magnification 20X ~ 300,000X *. Stage Movement X ±3.5 mm,Y ±2 mm,Z ±0.3 mm,Tilt ±15 tilt *. Sample holder Column insert type *. Sample excha...
Cheonan-si, South Korea