| Wafer size compatibility | 100–300 mm |
| Supported wafer diameters | 100, 150, 200, 300 |
| Probing stages | Motorized X-Y-Z with fine alignment |
| Probe card interface | Standard probe card mounting |
TEL Tokyo Electron 3381-000070-13 P-12XL Interface Board PCB Card Working Model No: BOARD, INTERFACE P-12XL 3308-000070-13 Made in Japan This TEL Tokyo Electron 3381-000070-13 P-12XL Interface Board PCB Card is u...
TEL Tokyo Electron 3381-000074-12 VME Sequence P-12XL PCB Assembly Working Model No: BOARD, VME SEQUENCE P-12XL 3308-000074-12 Made in Japan This TEL Tokyo Electron 3381-000074-12 VME Sequence P-12XL PCB Assembly...
TEL Tokyo Electron 3381-000079-12 Light Stack Board P-12XL PCB Working Surplus Model No: BOARD LIGHT STACK P-12XL 3308-000079-12 Made in Japan This TEL Tokyo Electron 3381-000079-12 Light Stack Board P-12XL PCB i...
TEL, P12XL Prober, 300mm, TEL P12XL Prober single foup VIP3A Tool Status Disconnected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober single foup VIP3A Software Version Rby00-R016.02U1 ...
TEL, P12XL, 300mm Tool ID: 33B5LA TEL P12XL Prober dual foup VIP3