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24

Used voltage detectors

  • Trusted Seller
    Jeol Scanning Electron Microscope (PC-SEM)

    Jeol Scanning Electron Microscope (PC-SEM) JSM-6490 Bruker XFlash Detector

    • used

    • Manufacturer: Jeol

    Jeol Type: Jeol JSM-6490 Jeol scanning electron microscope Jeol JSM-6490 scanning electron microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope with newly developed electron optics an...

    $41,012 USD

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    Est. $772/mo

    Borken, Germany
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    Hitachi S-4500 SEM , Scanning

    Hitachi S-4500 SEM , Scanning electron microscope with EDX detector , S 4500

    • used

    • Manufacturer: Hitachi
    • Model: S-4500

    Hitachi S-4500 , Scanning electron microscope Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustme...

    $26,834 USD

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    Est. $505/mo

    Bialogard, Poland
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    2010 JEOL 2100 Probe-Corrected Analytical

    2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope

    • used

    • Manufacturer: Jeol

    - Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measurements - Acceleration Voltage: 100 and 200 kV - Filament...

    United States
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    2018 Jeol JSM-IT200LV InTouchScope Scanning

    2018 Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope

    • used

    • Manufacturer: Jeol
    • Model: JSM

    Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope IXRF EDS detector included DOM: 2018 High resolution imaging in HV/LV/SE/BSE Zeromag-mode for intuitive transition from light-optic to SEM image Che...

    United States
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    2010 JEOL 2100 Probe-Corrected Analytical

    2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope

    • used

    • Manufacturer: Jeol

    Jeol 2100 Probe-Corrected Analytical Electron Microscope - Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measur...

    United States
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    JEOL JSM 7600 F SEM

    JEOL JSM 7600 F SEM

    • used

    • Manufacturer: Jeol
    • Model: JSM

    Resolution: - 1nm guaranteed at 15kV SEM mode - 2.5nm at 1kV in SEM mode - 1.5nm at 1kV in GB mode Magnification: - SEM: x100 (at WD 25mm) to x1,000,000 (at WD 8mm) - Low-Mag LM mode: x25 to x19,000 Imagin...

    United States
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    Hitachi S 3000 N Scanning

    Hitachi S 3000 N Scanning Electron Microscope (SEM)

    • used

    • Manufacturer: Hitachi
    • Model: S-3000N

    - Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...

    United States
  • FEI Nova NanoSEM 600

    FEI Nova NanoSEM 600

    • refurbished

    • Manufacturer: FEI
    • Model: NOVA NANOSEM 600

    “Large chamber field emission electron microscope. Currently installed and running, available for demonstration. Installation and training available.” This listing is for one Refurbished FEI Nova NanoSEM 600 Scan...

    Sparks, NV
  • Jeol JSM-6100 | Scanning Electron

    Jeol JSM-6100 | Scanning Electron Microscope (SEM)

    • used

    • Manufacturer: Jeol
    • Model: JSM

    For parts or not working “Unable to test, Selling for parts, Sold as is” TECHNICAL SPECIFICATIONS Brand: Jeol Model: JSM-6100 Device Type: Scanning Electron Microscope (SEM) Maximum Resolution: Up to 16 nm ...

    Tijuana, Mexico
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    1998 Hitachi S 5000 Field

    1998 Hitachi S 5000 Field Emission Scanning Electron Microscope

    • used

    • Manufacturer: Hitachi
    • Model: S-5000

    - Ultra High Resolution - Accelerating Voltage: 30 kV - Magnification: 500,000x Performance - Image Resolution: 0.6 nm (at 30 kV),3.5 nm (at 1 kV) in secondary electron image Magnification - Low mag mode: x...

    United States
  • Hitachi TM1000 tabletop SEM with

    Hitachi TM1000 tabletop SEM with Oxford EDS and motorized stage

    • used

    • Manufacturer: Hitachi

    Original Performance Specifications: - Magnification 20~10,000x (2x, 4x digital zoom) - Accelerating Voltage 15kV - Hi Sensitivity Solid-State Backscattered Detector - Standard observation mode and Charge-up redu...

    $16,500 USD

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    Est. $324/mo

    San Jose, CA
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    2011 JEOL JSM 7001F Schottky

    2011 JEOL JSM 7001F Schottky Emission SEM

    • used

    • Manufacturer: Jeol
    • Model: JSM

    Resolution: 1.2 nm at 30 kV, 3.0 nm at 1.0 kV Accelerating Voltage: 0.5 to 30 kV Specimen Stage: Mechanically eucentric at all WDs Imaging modes: SE, BEI to E/T detector OS: Windows 10 External Detectors: None

    United Kingdom
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    Hitachi S3000H SEM Scanning Electron

    Hitachi S3000H SEM Scanning Electron Microscope Lab

    • used

    • Manufacturer: Hitachi
    • Model: S-3000

    This Hitachi S3000H SEM Scanning Electron Microscope is being sold on behalf of a laboratory. It is surplus to requirements. The lab informed us that it was working when last used. The microscope is from 1998, ha...

    $6,075 USD

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    Est. $119/mo

    Wales, United Kingdom
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    Hitachi S-4500

    Hitachi S-4500

    • used

    • Manufacturer: Hitachi
    • Model: S-4500

    Hitachi S-4500 , Scanning electron microscope Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustmen...

    Bialogard, Poland
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    2003 HITACHI S-4500 , Scanning

    2003 HITACHI S-4500 , Scanning electron microscope

    • used

    • Manufacturer: Hitachi
    • Model: S-4500

    Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustment in X, Y, Z directions, BSE detector Centauru...

    Europe
12

Overview

Microscopes are precision instruments used to magnify small objects, making them essential in fields like biology, medicine, and materials science. They come in various types, including optical, electron, and digital microscopes, each serving specific applications. Microscopes are crucial for research, diagnostics, and education, providing detailed views of specimens that are otherwise invisible to the naked eye.

FAQ

What should I consider when buying a microscope?

Consider the type of microscope (optical, electron, digital), its magnification power, resolution, and the specific needs of your application. Also, check for the condition of lenses and the overall build quality.

How do I ensure the microscope is shipped safely?

Use a trusted shipping service that specializes in delicate instruments. Ensure the microscope is well-packaged with adequate padding and secured to prevent movement during transit.

What is the maintenance schedule for a microscope?

Regularly clean the lenses and eyepieces with appropriate cleaning solutions. Check and calibrate the focus and alignment. Store the microscope in a dust-free environment when not in use. Refer to the manufacturer's manual for specific maintenance guidelines.