Agilent - Keysight 4155C Test & Measurement (semiconductors)
Used
Doubleclick to zoom in
Specifications
- Condition
- used
- Year
- 2005
- 020
- Delete Windows Controller For Parametric Analysis And Characterization
- 0kn
- Self Paced Training
- 200
- 1.5 m
- 230
- 3.0 m
- A6j
- 540.0
- Aba
- U.S. English Localization
- Abj
- Japan Japanese Localization
- Cal
- Calibration Available
- L25
- 3.0
- As is
- Unit Sold As Is
- Listing ID
- 168013
Description
Good condition Agilent - Keysight 4155C Test & Measurement (semiconductors)s manufactured in 2005. Located in USA and other countries. Click request price for more information.