2010 KLA TENCOR Candela CS20
- Manufacturer: KLA-Tencor
- Model: CANDELA CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
1997 Schmitt Measurement System TMS 2000
- Manufacturer: Schmitt Measurement System
AS-IS Wafer size: 6" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
N&K OptiPrime - CD
- Manufacturer: N&K
Key Qualities of OptiPrime - CD ■ Optimized Polarized Reflectance (Rs and Rp) Data - Micro-Spot Technology ■ Can be Configured for 300 mm (12”), 200 mm (8”),and 150 mm (6”) Wafers ■ Fully Automated ■ Based on Pat...
Cheonan-si, South Korea
Microsense Microsense 6033T
- Manufacturer: Microsense
Wafer Thickness gauge for up to 150mm wafers Wafer size: 6" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
SOLID STATE MEASRUEMENT INC. SSM2000
- Manufacturer: SOLID STATE MEASRUEMENT INC.
System Measurement Performance Computer Subsystem Automated Features •;; Probe conditioning /•;; Probe calibration /•;; Sample alignment /•;; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing S...
Cheonan-si, South Korea
2006 N&K N&K 5000-CD
- Manufacturer: N&K
To be fully refurbished. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
BIO-RAD QS-300
- Manufacturer: Bio-Rad
- Model: QS-300
BIO-RAD FT-IR QS-300 Spectrometer .FTS40 Spectrometer - He-Ne Laser - IR Source - DTGS Detector - KBr Beam Splitter .Up to 8 Inch, Wafer Tray/Nose Cone .FTS Power Supply .Windows XP PC & LCD Monitor .EPI,BPSG, C....
Cheonan-si, South Korea
1998 PROMETRIX RS35
- Manufacturer: PROMETRIX
*. Measurement perfomance: - 4 Point Probe check surface on Silicon wafer - Measurement range 5 Megohm/sq - Routine check 1-30 sites programmable - Counter/ 3-D map, Diameter scan 49,81,121,225,361,441,625 site...
Cheonan-si, South Korea
1994 BIO-RAD QS-300
- Manufacturer: Bio-Rad
- Model: QS-300
■ Capable 4" to 8" Wafer ■ Optical Console - Michelson Interferometer - KBr Beam split / - DTGS Detector & Element - He-Ne Laser & IR Source ■ Wafer Tray / Nose cone - Wafer Size : up to 8" / - Ruler increm...
Cheonan-si, South Korea
1999 VEECO VEECO Detak V200-SL
- Manufacturer: Veeco - Sloan
As-Is Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2002 KLA TENCOR P-15
- Manufacturer: KLA-Tencor
- Model: P-15
- Long Scan Profiler P-15 Measurement. - Micro Head II SR - Pentium III 733MHz, Ram 256MB & 19" LCD Color Monitor, Windows NT 4.0 - Installed in Clean-room. - Can demonstrate any time.
Cheonan-si, South Korea
SDI/SEMILAB FAaST 230
- Manufacturer: Semilab
- Model: FAAST 230
. Up to 8" . Automatic robotic wafer handling . Single open-cassette wafer loading station . Measurement of dielectric and interface properties on monitor wafer - Dielectric Capacitance (CD) and Thickness (EOT) -...
Cheonan-si, South Korea
SDI/SEMILAB FAaST 200 SL
- Manufacturer: Semilab
- Model: FAAST 200 SL
non-contact electrical C-V & I-V measurement system capable of measuring on product wafers. Measurements can be made in scribe line test sites or in the active cell area. Cell measurements allow for the first ti...
Cheonan-si, South Korea
2018 SDI/SEMILAB WT-2020
- Manufacturer: Semilab
■ System Configuration . WT2020 main unit with scanning capability . μ-PCR head for lifetime measurements . Vacuum pump . Utility : ■ Hadware Function Capability . μ-PCD measurement (904 nm Laser) . Laser Power F...
Cheonan-si, South Korea
2010 SDI/SEMILAB MCV2500
- Manufacturer: Semilab
■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ CDA: 8...
Cheonan-si, South Korea
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